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E<sup>2</sup>MD for reduction of motion artifacts from photoplethysmographic signals

contributor authorRaghuram, M. , Sivani, K. , Reddy, K.A.
date accessioned2020-03-12T23:27:25Z
date available2020-03-12T23:27:25Z
date issued2014
identifier other6892793.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1112313?show=full
formatgeneral
languageEnglish
publisherIEEE
titleE<sup>2</sup>MD for reduction of motion artifacts from photoplethysmographic signals
typeConference Paper
contenttypeMetadata Only
identifier padid8281225
subject keywordsfault diagnosis
subject keywordslogic testing
subject keywordsmicroprocessor chips
subject keywordsreduced instruction set computing
subject keywordssystem-on-chip
subject keywordsPowerPC derived processor
subject keywordsSBST approach
subject keywordsdecode units
subject keywordsfunctional test programs
subject keywordsin-field functional testing
subject keywordsindustrial SoC device
subject keywordsinstruction classification
subject keywordsinstruction manipulation
subject keywordspipelined RISC processors
subject keywordssignatures collection
subject keywordsstuck-at fault coverage
subject keywordsEncoding
subject keywordsLaw
subject keywordsReduced instruction set computing
subject keywordsRegisters
subject keywordsTesting
subject keywordsSoftware-Based Self-Test programs
subject keywordsdecode unit
subject keywordsfault grading
identifier doi10.1109/DFT.2014.6962090
journal titlelectronics and Communication Systems (ICECS), 2014 International Conference on
filesize1633167
citations0


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