E<sup>2</sup>MD for reduction of motion artifacts from photoplethysmographic signals
Publisher:
Year
: 2014DOI: 10.1109/DFT.2014.6962090
Keyword(s): fault diagnosis,logic testing,microprocessor chips,reduced instruction set computing,system-on-chip,PowerPC derived processor,SBST approach,decode units,functional test programs,in-field functional testing,industrial SoC device,instruction classification,instruction manipulation,pipelined RISC processors,signatures collection,stuck-at fault coverage,Encoding,Law,Reduced instruction set computing,Registers,Testing,Software-Based Self-Test programs,decode unit,fault grading
Collections
:
-
Statistics
E<sup>2</sup>MD for reduction of motion artifacts from photoplethysmographic signals
Show full item record
| contributor author | Raghuram, M. , Sivani, K. , Reddy, K.A. | |
| date accessioned | 2020-03-12T23:27:25Z | |
| date available | 2020-03-12T23:27:25Z | |
| date issued | 2014 | |
| identifier other | 6892793.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1112313?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | E<sup>2</sup>MD for reduction of motion artifacts from photoplethysmographic signals | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8281225 | |
| subject keywords | fault diagnosis | |
| subject keywords | logic testing | |
| subject keywords | microprocessor chips | |
| subject keywords | reduced instruction set computing | |
| subject keywords | system-on-chip | |
| subject keywords | PowerPC derived processor | |
| subject keywords | SBST approach | |
| subject keywords | decode units | |
| subject keywords | functional test programs | |
| subject keywords | in-field functional testing | |
| subject keywords | industrial SoC device | |
| subject keywords | instruction classification | |
| subject keywords | instruction manipulation | |
| subject keywords | pipelined RISC processors | |
| subject keywords | signatures collection | |
| subject keywords | stuck-at fault coverage | |
| subject keywords | Encoding | |
| subject keywords | Law | |
| subject keywords | Reduced instruction set computing | |
| subject keywords | Registers | |
| subject keywords | Testing | |
| subject keywords | Software-Based Self-Test programs | |
| subject keywords | decode unit | |
| subject keywords | fault grading | |
| identifier doi | 10.1109/DFT.2014.6962090 | |
| journal title | lectronics and Communication Systems (ICECS), 2014 International Conference on | |
| filesize | 1633167 | |
| citations | 0 |