Optimization of Test Pin-Count, Test Scheduling, and Test Access for NoC-Based Multicore SoCs
ناشر:
سال
: 2014شناسه الکترونیک: 10.1109/TC.2013.82
کلیدواژه(گان): automatic test equipment,multiprocessing systems,network-on-chip,optimisation,scheduling,ATE,I/O resources,MISR,NoC-based multicore SoC,automated test equipment,network-on-chip,pin-count-aware optimization,resource utilization,test access mechanism designs,test pin-count,test scheduling,Optimization,Pins,Power demand,Routing,Schedules,System-on-chip,Testing,SOC testing,System-on-chip,network-on-chip,test time
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آمار بازدید
Optimization of Test Pin-Count, Test Scheduling, and Test Access for NoC-Based Multicore SoCs
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| contributor author | Richter, Maximilian | |
| contributor author | Chakrabarty, Krishnendu | |
| date accessioned | 2020-03-12T18:22:39Z | |
| date available | 2020-03-12T18:22:39Z | |
| date issued | 2014 | |
| identifier issn | 0018-9340 | |
| identifier other | 6495447.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/956417 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Optimization of Test Pin-Count, Test Scheduling, and Test Access for NoC-Based Multicore SoCs | |
| type | Journal Paper | |
| contenttype | Metadata Only | |
| identifier padid | 7988444 | |
| subject keywords | automatic test equipment | |
| subject keywords | multiprocessing systems | |
| subject keywords | network-on-chip | |
| subject keywords | optimisation | |
| subject keywords | scheduling | |
| subject keywords | ATE | |
| subject keywords | I/O resources | |
| subject keywords | MISR | |
| subject keywords | NoC-based multicore SoC | |
| subject keywords | automated test equipment | |
| subject keywords | network-on-chip | |
| subject keywords | pin-count-aware optimization | |
| subject keywords | resource utilization | |
| subject keywords | test access mechanism designs | |
| subject keywords | test pin-count | |
| subject keywords | test scheduling | |
| subject keywords | Optimization | |
| subject keywords | Pins | |
| subject keywords | Power demand | |
| subject keywords | Routing | |
| subject keywords | Schedules | |
| subject keywords | System-on-chip | |
| subject keywords | Testing | |
| subject keywords | SOC testing | |
| subject keywords | System-on-chip | |
| subject keywords | network-on-chip | |
| subject keywords | test time | |
| identifier doi | 10.1109/TC.2013.82 | |
| journal title | Computers, IEEE Transactions on | |
| journal volume | 63 | |
| journal issue | 3 | |
| filesize | 1808124 | |
| citations | 0 |