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Now showing items 1-10 of 11

A near-optimal randomized algorithm for uplink resource allocation in OFDMA systems

Type: Conference Paper

Author : Yang Yang , Changwon Nam , Shroff, N.B.

Publisher: IEEE

Year: 2014

Hysteresis Loss of REBCO Conductor Up to 35 T

Type: Journal Paper

Author : Lu, Jun; Choi, E.S.; Kandel, H.; Abraimov, D.V.; Markiewicz, W.D.

Publisher: IEEE

Year: 2014

Self-Field Effects and AC Losses in Pancake Coils Assembled From Coated Conductor Roebel Cables

Type: Journal Paper

Author : Grilli, Francesco; Zermeno, Victor M. R.; Pardo, Edison; Vojenciak, Michal; Brand, Jorg; Kario, A.; Goldacker, Wilfried

Publisher: IEEE

Year: 2014

Learning visual-motor Cell Assemblies for the iCub robot using a neuroanatomically grounded neural network

Type: Conference Paper

Author : Adams, S.V.; Wennekers, T.; Cangelosi, A.; Garagnani, M.; Pulvermuller, F.

Publisher: IEEE

Year: 2014

Single Event Hard Errors in SRAM Under Heavy Ion Irradiation

Type: Journal Paper

Author : Haran, Avner; Barak, Joseph; David, David; Keren, Eitan; Refaeli, Nati; Rapaport, Shimshon

Publisher: IEEE

Year: 2014

The Dependence of Magnetic Properties on Diameters of One-Dimensional Nickel Nanostructures

Type: Journal Paper

Author : Jinqiong Zhang; Xiufang Qin; Torre, B.; Hao Zeng; Xiao-Hong Xu

Publisher: IEEE

Year: 2014

Self-Consistent Modeling of the <formula formulatype="inline"> <img src="/images/tex/17131.gif" alt="I_{c}"> </formula> of HTS Devices: How Accurate do Models Really Need to Be?

Type: Journal Paper

Author : Grilli, Francesco; Sirois, Frederic; Zermeno, Victor M. R.; Vojenciak, Michal

Publisher: IEEE

Year: 2014

State and Angular Dependence of Single-Event Upsets in an Asymmetric RC-Hardened SRAM Using Deep Trench Capacitors

Type: Journal Paper

Author : Alles, Michael L.; Schrimpf, R.D.; Massengill, Lloyd W.; Ball, D.R.; Kelly, Andrew T.; Haddad, Nadim F.; Rodgers, John C.; Ross, Jason F.; Chan, Erwin Hoi Wing; Raman, Ashok; Turowski, Marek

Publisher: IEEE

Year: 2014

Upsets in Phase Change Memories Due to High-LET Heavy Ions Impinging at an Angle

Type: Journal Paper

Author : Gerardin, Simone; Bagatin, Marta; Paccagnella, Alessandro; Visconti, Angelo; Bonanomi, M.; Beltrami, S.; Ferlet-Cavrois, Veronique

Publisher: IEEE

Year: 2014

Welcome VTS President

Type: Conference Paper

Publisher: IEEE

Year: 2014

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A near-optimal randomized algorithm for uplink resource allocation in OFDMA systems

Hysteresis Loss of REBCO Conductor Up to 35 T

Self-Field Effects and AC Losses in Pancake Coils Assembled From Coated Conductor Roebel Cables

Learning visual-motor Cell Assemblies for the iCub robot using a neuroanatomically grounded neural network

Single Event Hard Errors in SRAM Under Heavy Ion Irradiation

The Dependence of Magnetic Properties on Diameters of One-Dimensional Nickel Nanostructures

Self-Consistent Modeling of the <formula formulatype="inline"> <img src="/images/tex/17131.gif" alt="I_{c}"> </formula> of HTS Devices: How Accurate do Models Really Need to Be?

State and Angular Dependence of Single-Event Upsets in an Asymmetric RC-Hardened SRAM Using Deep Trench Capacitors

Upsets in Phase Change Memories Due to High-LET Heavy Ions Impinging at an Angle

Welcome VTS President

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A near-optimal randomized algorithm for uplink resource allocation in OFDMA systems

Hysteresis Loss of REBCO Conductor Up to 35 T

Self-Field Effects and AC Losses in Pancake Coils Assembled From Coated Conductor Roebel Cables

Learning visual-motor Cell Assemblies for the iCub robot using a neuroanatomically grounded neural network

Single Event Hard Errors in SRAM Under Heavy Ion Irradiation

The Dependence of Magnetic Properties on Diameters of One-Dimensional Nickel Nanostructures

Self-Consistent Modeling of the <formula formulatype="inline"> <img src="/images/tex/17131.gif" alt="I_{c}"> </formula> of HTS Devices: How Accurate do Models Really Need to Be?

State and Angular Dependence of Single-Event Upsets in an Asymmetric RC-Hardened SRAM Using Deep Trench Capacitors

Upsets in Phase Change Memories Due to High-LET Heavy Ions Impinging at an Angle

Welcome VTS President