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Provenance-Based Prediction Scheme for Object Storage System in HPC

contributor authorDong Dai , Yong Chen , Kimpe, D. , Ross, R.
date accessioned2020-03-12T20:01:16Z
date available2020-03-12T20:01:16Z
date issued2014
identifier other6846497.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/998839?show=full
formatgeneral
languageEnglish
publisherIEEE
titleProvenance-Based Prediction Scheme for Object Storage System in HPC
typeConference Paper
contenttypeMetadata Only
identifier padid8119086
subject keywordsMOSFET
subject keywordscores
subject keywordselemental semiconductors
subject keywordsintegrated circuit design
subject keywordsleakage currents
subject keywordslow-power electronics
subject keywordsradiation hardening (electronics)
subject keywordssilicon
subject keywordsI/O devices
subject keywordsI/O transistors
subject keywordsSi
subject keywordsTID tolerance
subject keywordsbulk silicon nMOSFET
subject keywordscore devices
subject keywordsdevice geometry
subject keywordsintegrated circuit
subject keywordsoff-state leakage current degradation
subject keywordsradiation induced threshold voltage shift
subject keywordsradiation response
subject keywordsradiation-hardened design
subject keywordssize 65 nm
subject keywordsstatic power consumption
subject keywordstotal ionizing dose
subject keywordsAbstracts
subject keywordsMOSFET
subject keywordsMOSFET circuits
identifier doi10.1109/ICSICT.2014.7021437
journal titleluster, Cloud and Grid Computing (CCGrid), 2014 14th IEEE/ACM International Symposium on
filesize553758
citations0


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