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Opportunistic High Energy Physics Computing in User Space with Parrot

Author:
Skeehan, D. , Brenner, P. , Tovar, B. , Thain, D. , Valls, N. , Woodard, A. , Wolf, M. , Pearson, T. , Lynch, S. , Lannon, K.
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/ICSICT.2014.7021392
URI: https://libsearch.um.ac.ir:443/fum/handle/fum/998795
Keyword(s): field effect transistors,semiconductor doping,thermal diffusion,tunnelling,TFET,ambipolar characteristics,drain doping concentration,high on-current tunneling field effect transistor fabrication,rapid thermal diffusion,spin-on-dopant investigation,surface doping concentration,Boron,Doping,Films,MOS devices,Phosphors,Silicon,Surface treatment
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    Opportunistic High Energy Physics Computing in User Space with Parrot

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date accessioned2020-03-12T20:01:11Z
date available2020-03-12T20:01:11Z
date issued2014
identifier other6846452.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/998795
formatgeneral
languageEnglish
publisherIEEE
titleOpportunistic High Energy Physics Computing in User Space with Parrot
typeConference Paper
contenttypeMetadata Only
identifier padid8119038
subject keywordsfield effect transistors
subject keywordssemiconductor doping
subject keywordsthermal diffusion
subject keywordstunnelling
subject keywordsTFET
subject keywordsambipolar characteristics
subject keywordsdrain doping concentration
subject keywordshigh on-current tunneling field effect transistor fabrication
subject keywordsrapid thermal diffusion
subject keywordsspin-on-dopant investigation
subject keywordssurface doping concentration
subject keywordsBoron
subject keywordsDoping
subject keywordsFilms
subject keywordsMOS devices
subject keywordsPhosphors
subject keywordsSilicon
subject keywordsSurface treatment
identifier doi10.1109/ICSICT.2014.7021392
journal titleluster, Cloud and Grid Computing (CCGrid), 2014 14th IEEE/ACM International Symposium on
filesize303680
citations0
contributor rawauthorSkeehan, D. , Brenner, P. , Tovar, B. , Thain, D. , Valls, N. , Woodard, A. , Wolf, M. , Pearson, T. , Lynch, S. , Lannon, K.
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