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Identification of testable representative paths for low-cost verification of circuit performance during manufacturing and in-field tests

contributor authorJifeng Chen , Winemberg, L. , Tehranipoor, M.
date accessioned2020-03-12T19:46:39Z
date available2020-03-12T19:46:39Z
date issued2014
identifier other6818782.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/989716?show=full
formatgeneral
languageEnglish
publisherIEEE
titleIdentification of testable representative paths for low-cost verification of circuit performance during manufacturing and in-field tests
typeConference Paper
contenttypeMetadata Only
identifier padid8105979
subject keywordsBatteries
subject keywordsDischarges (electric)
subject keywordsEducational institutions
subject keywordsInverters
subject keywordsLoad flow
subject keywordsLoad modeling
subject keywordsVoltage control
subject keywordsBattery energy storage system
subject keywordsLoad levelling
subject keywordsPV generation
subject keywordsPeak shaving
subject keywordsVoltage rise
identifier doi10.1109/AUPEC.2014.6966642
journal titleLSI Test Symposium (VTS), 2014 IEEE 32nd
filesize1472594
citations0


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