Identification of testable representative paths for low-cost verification of circuit performance during manufacturing and in-field tests
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: 2014DOI: 10.1109/AUPEC.2014.6966642
Keyword(s): Batteries,Discharges (electric),Educational institutions,Inverters,Load flow,Load modeling,Voltage control,Battery energy storage system,Load levelling,PV generation,Peak shaving,Voltage rise
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Identification of testable representative paths for low-cost verification of circuit performance during manufacturing and in-field tests
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| contributor author | Jifeng Chen , Winemberg, L. , Tehranipoor, M. | |
| date accessioned | 2020-03-12T19:46:39Z | |
| date available | 2020-03-12T19:46:39Z | |
| date issued | 2014 | |
| identifier other | 6818782.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/989716 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Identification of testable representative paths for low-cost verification of circuit performance during manufacturing and in-field tests | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8105979 | |
| subject keywords | Batteries | |
| subject keywords | Discharges (electric) | |
| subject keywords | Educational institutions | |
| subject keywords | Inverters | |
| subject keywords | Load flow | |
| subject keywords | Load modeling | |
| subject keywords | Voltage control | |
| subject keywords | Battery energy storage system | |
| subject keywords | Load levelling | |
| subject keywords | PV generation | |
| subject keywords | Peak shaving | |
| subject keywords | Voltage rise | |
| identifier doi | 10.1109/AUPEC.2014.6966642 | |
| journal title | LSI Test Symposium (VTS), 2014 IEEE 32nd | |
| filesize | 1472594 | |
| citations | 0 |


