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Performance optimization of PVM based parallel applications using optimal number of slaves

Author:
Sampath, S. , Nanjesh, B.R. , Sagar, B.B. , Subbaraya, C.K.
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/SBMicro.2014.6940078
URI: https://libsearch.um.ac.ir:443/fum/handle/fum/984838
Keyword(s): SRAM chips,interface states,stochastic processes,technology CAD (electronics),3D TCAD simulation,6T-SRAM cell read and write operation,RD model,bias temperature instability,device-level variability simulation,interface trap generation,pre-existing bulk trap charging,simple exponential impact assumption,small area device,stochastic BTl modeling,stochastic reaction diffusion model,threshold voltage generation,threshold voltage shift distribution,Computational modeling,Integrated
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    Performance optimization of PVM based parallel applications using optimal number of slaves

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date accessioned2020-03-12T19:38:54Z
date available2020-03-12T19:38:54Z
date issued2014
identifier other6798360.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/984838
formatgeneral
languageEnglish
publisherIEEE
titlePerformance optimization of PVM based parallel applications using optimal number of slaves
typeConference Paper
contenttypeMetadata Only
identifier padid8100358
subject keywordsSRAM chips
subject keywordsinterface states
subject keywordsstochastic processes
subject keywordstechnology CAD (electronics)
subject keywords3D TCAD simulation
subject keywords6T-SRAM cell read and write operation
subject keywordsRD model
subject keywordsbias temperature instability
subject keywordsdevice-level variability simulation
subject keywordsinterface trap generation
subject keywordspre-existing bulk trap charging
subject keywordssimple exponential impact assumption
subject keywordssmall area device
subject keywordsstochastic BTl modeling
subject keywordsstochastic reaction diffusion model
subject keywordsthreshold voltage generation
subject keywordsthreshold voltage shift distribution
subject keywordsComputational modeling
subject keywordsIntegrated
identifier doi10.1109/SBMicro.2014.6940078
journal titleptimization, Reliabilty, and Information Technology (ICROIT), 2014 International Conference on
filesize2045375
citations0
contributor rawauthorSampath, S. , Nanjesh, B.R. , Sagar, B.B. , Subbaraya, C.K.
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