Study and analysis of Social network Aggregator
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سال
: 2014شناسه الکترونیک: 10.1109/IIT.2014.6940022
کلیدواژه(گان): doping profiles,electrostatics,ion implantation,Axcelis HE3,CIS manufacturers,IC manufacturers,Purion XE high energy ion implanter,angle control,batch implanters,box-like dopant profile,cone angle effect,damage characteristics,damage engineering,damage reduction,dose stability,electrostatic scanning,paradigm XE systems,serial high energy ion implanters,system mechanical throughput limit utilization,tool architecture,Current measurement,Electrostatics,Implants,Ion beams,St
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Study and analysis of Social network Aggregator
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contributor author | Virmani, C. , Pillai, A. , Juneja, D. | |
date accessioned | 2020-03-12T19:38:49Z | |
date available | 2020-03-12T19:38:49Z | |
date issued | 2014 | |
identifier other | 6798314.pdf | |
identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/984794 | |
format | general | |
language | English | |
publisher | IEEE | |
title | Study and analysis of Social network Aggregator | |
type | Conference Paper | |
contenttype | Metadata Only | |
identifier padid | 8100305 | |
subject keywords | doping profiles | |
subject keywords | electrostatics | |
subject keywords | ion implantation | |
subject keywords | Axcelis HE3 | |
subject keywords | CIS manufacturers | |
subject keywords | IC manufacturers | |
subject keywords | Purion XE high energy ion implanter | |
subject keywords | angle control | |
subject keywords | batch implanters | |
subject keywords | box-like dopant profile | |
subject keywords | cone angle effect | |
subject keywords | damage characteristics | |
subject keywords | damage engineering | |
subject keywords | damage reduction | |
subject keywords | dose stability | |
subject keywords | electrostatic scanning | |
subject keywords | paradigm XE systems | |
subject keywords | serial high energy ion implanters | |
subject keywords | system mechanical throughput limit utilization | |
subject keywords | tool architecture | |
subject keywords | Current measurement | |
subject keywords | Electrostatics | |
subject keywords | Implants | |
subject keywords | Ion beams | |
subject keywords | St | |
identifier doi | 10.1109/IIT.2014.6940022 | |
journal title | ptimization, Reliabilty, and Information Technology (ICROIT), 2014 International Conference on | |
filesize | 562610 | |
citations | 1 |