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Observation of the Microstructure of Grain Boundary Oxides in Superconducting RF-Quality Niobium With High-Resolution TEM (Transmission Electron Microscope)

contributor authorSung, Z.-H.
contributor authorLee, P.J.
contributor authorLarbalestier, D.C.
date accessioned2020-03-12T18:31:43Z
date available2020-03-12T18:31:43Z
date issued2014
identifier issn1051-8223
identifier other6654256.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/961491?show=full
formatgeneral
languageEnglish
publisherIEEE
titleObservation of the Microstructure of Grain Boundary Oxides in Superconducting RF-Quality Niobium With High-Resolution TEM (Transmission Electron Microscope)
typeJournal Paper
contenttypeMetadata Only
identifier padid7994295
subject keywordsbicrystals
subject keywordscrystal microstructure
subject keywordsfocused ion beam technology
subject keywordsgrain boundaries
subject keywordsniobium
subject keywordssurface treatment
subject keywordstransmission electron microscopy
subject keywordstransparency
subject keywordstype II superconductors
subject keywordsNb
subject keywordsdislocation pile-ups
subject keywordselectron transparency
subject keywordsfocused ion beam methods
subject keywordsgrain boundary oxides
subject keywordshigh-resolution TEM
subject keywordshigh-resolution transmission electron microscopy
subject keywordsimpurity segregations
subject keywordsmagnetic flux penetration
subject keywordsmagnetooptical measurements
subject keywordsmetallographic methods
subject keywordsmicrostructure
subject keywordsoxide phases
subject keywordsoxidization
subject keywordss
identifier doi10.1109/TASC.2013.2287050
journal titleApplied Superconductivity, IEEE Transactions on
journal volume24
journal issue1
filesize461201
citations0


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