Observation of the Microstructure of Grain Boundary Oxides in Superconducting RF-Quality Niobium With High-Resolution TEM (Transmission Electron Microscope)
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: 2014DOI: 10.1109/TASC.2013.2287050
Keyword(s): bicrystals,crystal microstructure,focused ion beam technology,grain boundaries,niobium,surface treatment,transmission electron microscopy,transparency,type II superconductors,Nb,dislocation pile-ups,electron transparency,focused ion beam methods,grain boundary oxides,high-resolution TEM,high-resolution transmission electron microscopy,impurity segregations,magnetic flux penetration,magnetooptical measurements,metallographic methods,microstructure,oxide phases,oxidization,s
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Observation of the Microstructure of Grain Boundary Oxides in Superconducting RF-Quality Niobium With High-Resolution TEM (Transmission Electron Microscope)
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| contributor author | Sung, Z.-H. | |
| contributor author | Lee, P.J. | |
| contributor author | Larbalestier, D.C. | |
| date accessioned | 2020-03-12T18:31:43Z | |
| date available | 2020-03-12T18:31:43Z | |
| date issued | 2014 | |
| identifier issn | 1051-8223 | |
| identifier other | 6654256.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/961491 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Observation of the Microstructure of Grain Boundary Oxides in Superconducting RF-Quality Niobium With High-Resolution TEM (Transmission Electron Microscope) | |
| type | Journal Paper | |
| contenttype | Metadata Only | |
| identifier padid | 7994295 | |
| subject keywords | bicrystals | |
| subject keywords | crystal microstructure | |
| subject keywords | focused ion beam technology | |
| subject keywords | grain boundaries | |
| subject keywords | niobium | |
| subject keywords | surface treatment | |
| subject keywords | transmission electron microscopy | |
| subject keywords | transparency | |
| subject keywords | type II superconductors | |
| subject keywords | Nb | |
| subject keywords | dislocation pile-ups | |
| subject keywords | electron transparency | |
| subject keywords | focused ion beam methods | |
| subject keywords | grain boundary oxides | |
| subject keywords | high-resolution TEM | |
| subject keywords | high-resolution transmission electron microscopy | |
| subject keywords | impurity segregations | |
| subject keywords | magnetic flux penetration | |
| subject keywords | magnetooptical measurements | |
| subject keywords | metallographic methods | |
| subject keywords | microstructure | |
| subject keywords | oxide phases | |
| subject keywords | oxidization | |
| subject keywords | s | |
| identifier doi | 10.1109/TASC.2013.2287050 | |
| journal title | Applied Superconductivity, IEEE Transactions on | |
| journal volume | 24 | |
| journal issue | 1 | |
| filesize | 461201 | |
| citations | 0 |