The Role of Feedback Resistors and TID Effects in the ASET Response of a High Speed Current Feedback Amplifier
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: 2014شناسه الکترونیک: 10.1109/TNS.2014.2369347
کلیدواژه(گان): circuit stability,feedback amplifiers,radiation hardening (electronics),resistors,AD844 CFA,ASET response,ASET sensitivity,ASET shapes,PLSEE,TID effects,amplifier stability,analog single event transients,bipolar transistor,circuit electrical parameters,closed-loop gain,external circuit designs,feedback resistors,feedback theory,general electronic rules,high speed current feedback amplifier,pulsed laser single event effect simulation technique,total ionizing dose,Bipolar int
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The Role of Feedback Resistors and TID Effects in the ASET Response of a High Speed Current Feedback Amplifier
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contributor author | Roig, Fabien | |
contributor author | Dusseau, L. | |
contributor author | Ribeiro, P. | |
contributor author | Auriel, G. | |
contributor author | Roche, Nicholas J.-H | |
contributor author | Privat, A. | |
contributor author | Vaille, J.-R. | |
contributor author | Boch, J. | |
contributor author | Saigne, F. | |
contributor author | Marec, R. | |
contributor author | Calvel, P. | |
contributor author | Bezerra, F. | |
contributor author | Ecoffet, R. | |
contributor author | Azais, Bruno | |
date accessioned | 2020-03-13T00:31:10Z | |
date available | 2020-03-13T00:31:10Z | |
date issued | 2014 | |
identifier issn | 0018-9499 | |
identifier other | 6969838.pdf | |
identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1149675 | |
format | general | |
language | English | |
publisher | IEEE | |
title | The Role of Feedback Resistors and TID Effects in the ASET Response of a High Speed Current Feedback Amplifier | |
type | Journal Paper | |
contenttype | Metadata Only | |
identifier padid | 8332979 | |
subject keywords | circuit stability | |
subject keywords | feedback amplifiers | |
subject keywords | radiation hardening (electronics) | |
subject keywords | resistors | |
subject keywords | AD844 CFA | |
subject keywords | ASET response | |
subject keywords | ASET sensitivity | |
subject keywords | ASET shapes | |
subject keywords | PLSEE | |
subject keywords | TID effects | |
subject keywords | amplifier stability | |
subject keywords | analog single event transients | |
subject keywords | bipolar transistor | |
subject keywords | circuit electrical parameters | |
subject keywords | closed-loop gain | |
subject keywords | external circuit designs | |
subject keywords | feedback resistors | |
subject keywords | feedback theory | |
subject keywords | general electronic rules | |
subject keywords | high speed current feedback amplifier | |
subject keywords | pulsed laser single event effect simulation technique | |
subject keywords | total ionizing dose | |
subject keywords | Bipolar int | |
identifier doi | 10.1109/TNS.2014.2369347 | |
journal title | Nuclear Science, IEEE Transactions on | |
journal volume | 61 | |
journal issue | 6 | |
filesize | 2148578 | |
citations | 0 |