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The Role of Feedback Resistors and TID Effects in the ASET Response of a High Speed Current Feedback Amplifier

Author:
Roig, Fabien
,
Dusseau, L.
,
Ribeiro, P.
,
Auriel, G.
,
Roche, Nicholas J.-H
,
Privat, A.
,
Vaille, J.-R.
,
Boch, J.
,
Saigne, F.
,
Marec, R.
,
Calvel, P.
,
Bezerra, F.
,
Ecoffet, R.
,
Azais, Bruno
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/TNS.2014.2369347
URI: https://libsearch.um.ac.ir:443/fum/handle/fum/1149675
Keyword(s): circuit stability,feedback amplifiers,radiation hardening (electronics),resistors,AD844 CFA,ASET response,ASET sensitivity,ASET shapes,PLSEE,TID effects,amplifier stability,analog single event transients,bipolar transistor,circuit electrical parameters,closed-loop gain,external circuit designs,feedback resistors,feedback theory,general electronic rules,high speed current feedback amplifier,pulsed laser single event effect simulation technique,total ionizing dose,Bipolar int
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    The Role of Feedback Resistors and TID Effects in the ASET Response of a High Speed Current Feedback Amplifier

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contributor authorRoig, Fabien
contributor authorDusseau, L.
contributor authorRibeiro, P.
contributor authorAuriel, G.
contributor authorRoche, Nicholas J.-H
contributor authorPrivat, A.
contributor authorVaille, J.-R.
contributor authorBoch, J.
contributor authorSaigne, F.
contributor authorMarec, R.
contributor authorCalvel, P.
contributor authorBezerra, F.
contributor authorEcoffet, R.
contributor authorAzais, Bruno
date accessioned2020-03-13T00:31:10Z
date available2020-03-13T00:31:10Z
date issued2014
identifier issn0018-9499
identifier other6969838.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1149675
formatgeneral
languageEnglish
publisherIEEE
titleThe Role of Feedback Resistors and TID Effects in the ASET Response of a High Speed Current Feedback Amplifier
typeJournal Paper
contenttypeMetadata Only
identifier padid8332979
subject keywordscircuit stability
subject keywordsfeedback amplifiers
subject keywordsradiation hardening (electronics)
subject keywordsresistors
subject keywordsAD844 CFA
subject keywordsASET response
subject keywordsASET sensitivity
subject keywordsASET shapes
subject keywordsPLSEE
subject keywordsTID effects
subject keywordsamplifier stability
subject keywordsanalog single event transients
subject keywordsbipolar transistor
subject keywordscircuit electrical parameters
subject keywordsclosed-loop gain
subject keywordsexternal circuit designs
subject keywordsfeedback resistors
subject keywordsfeedback theory
subject keywordsgeneral electronic rules
subject keywordshigh speed current feedback amplifier
subject keywordspulsed laser single event effect simulation technique
subject keywordstotal ionizing dose
subject keywordsBipolar int
identifier doi10.1109/TNS.2014.2369347
journal titleNuclear Science, IEEE Transactions on
journal volume61
journal issue6
filesize2148578
citations0
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