90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica
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Year
: 2014DOI: 10.1109/TNS.2014.2363120
Keyword(s): SRAM chips,radiation hardening (electronics),Antarctica,Concordia Station,SRAM dynamic mode real-time testing,SRAM static mode real-time testing,atmospheric neutrons,high altitude memory test project,single event latchups,size 90 nm,soft error rate,static random access memories,Neutrons,Radiation effects,Real-time systems,SRAM cells,Terrestrial atmosphere,90&,#x00A0,nm,Concordia station,SRAM,atmospheric neutrons,isotropy,real-time
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90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica
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| contributor author | Tsiligiannis, G. | |
| contributor author | Dilillo, L. | |
| contributor author | Bosio, A. | |
| contributor author | Girard, P. | |
| contributor author | Pravossoudovitch, S. | |
| contributor author | Virazel, A. | |
| contributor author | Cocquerez, P. | |
| contributor author | Autran, J.L. | |
| contributor author | Litterio, A. | |
| contributor author | Wrobel, F. | |
| contributor author | Saigne, F. | |
| date accessioned | 2020-03-13T00:27:41Z | |
| date available | 2020-03-13T00:27:41Z | |
| date issued | 2014 | |
| identifier issn | 0018-9499 | |
| identifier other | 6940340.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1147609?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | 90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica | |
| type | Journal Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8330600 | |
| subject keywords | SRAM chips | |
| subject keywords | radiation hardening (electronics) | |
| subject keywords | Antarctica | |
| subject keywords | Concordia Station | |
| subject keywords | SRAM dynamic mode real-time testing | |
| subject keywords | SRAM static mode real-time testing | |
| subject keywords | atmospheric neutrons | |
| subject keywords | high altitude memory test project | |
| subject keywords | single event latchups | |
| subject keywords | size 90 nm | |
| subject keywords | soft error rate | |
| subject keywords | static random access memories | |
| subject keywords | Neutrons | |
| subject keywords | Radiation effects | |
| subject keywords | Real-time systems | |
| subject keywords | SRAM cells | |
| subject keywords | Terrestrial atmosphere | |
| subject keywords | 90& | |
| subject keywords | #x00A0 | |
| subject keywords | nm | |
| subject keywords | Concordia station | |
| subject keywords | SRAM | |
| subject keywords | atmospheric neutrons | |
| subject keywords | isotropy | |
| subject keywords | real-time | |
| identifier doi | 10.1109/TNS.2014.2363120 | |
| journal title | Nuclear Science, IEEE Transactions on | |
| journal volume | 61 | |
| journal issue | 6 | |
| filesize | 693459 | |
| citations | 0 |