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90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

contributor authorTsiligiannis, G.
contributor authorDilillo, L.
contributor authorBosio, A.
contributor authorGirard, P.
contributor authorPravossoudovitch, S.
contributor authorVirazel, A.
contributor authorCocquerez, P.
contributor authorAutran, J.L.
contributor authorLitterio, A.
contributor authorWrobel, F.
contributor authorSaigne, F.
date accessioned2020-03-13T00:27:41Z
date available2020-03-13T00:27:41Z
date issued2014
identifier issn0018-9499
identifier other6940340.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1147609?show=full
formatgeneral
languageEnglish
publisherIEEE
title90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica
typeJournal Paper
contenttypeMetadata Only
identifier padid8330600
subject keywordsSRAM chips
subject keywordsradiation hardening (electronics)
subject keywordsAntarctica
subject keywordsConcordia Station
subject keywordsSRAM dynamic mode real-time testing
subject keywordsSRAM static mode real-time testing
subject keywordsatmospheric neutrons
subject keywordshigh altitude memory test project
subject keywordssingle event latchups
subject keywordssize 90 nm
subject keywordssoft error rate
subject keywordsstatic random access memories
subject keywordsNeutrons
subject keywordsRadiation effects
subject keywordsReal-time systems
subject keywordsSRAM cells
subject keywordsTerrestrial atmosphere
subject keywords90&
subject keywords#x00A0
subject keywordsnm
subject keywordsConcordia station
subject keywordsSRAM
subject keywordsatmospheric neutrons
subject keywordsisotropy
subject keywordsreal-time
identifier doi10.1109/TNS.2014.2363120
journal titleNuclear Science, IEEE Transactions on
journal volume61
journal issue6
filesize693459
citations0


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