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PBTI-Induced Random Timing Jitter in Circuit-Speed Random Logic

contributor authorJiwu Lu
contributor authorJiao, Guangfan
contributor authorVaz, C.
contributor authorCampbell, J.P.
contributor authorRyan, J.T.
contributor authorCheung, K.P.
contributor authorBersuker, Gennadi
contributor authorYoung, Cliff
date accessioned2020-03-13T00:23:30Z
date available2020-03-13T00:23:30Z
date issued2014
identifier issn0018-9383
identifier other6906250.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1144982?show=full
formatgeneral
languageEnglish
publisherIEEE
titlePBTI-Induced Random Timing Jitter in Circuit-Speed Random Logic
typeJournal Paper
contenttypeMetadata Only
identifier padid8327674
subject keywordslogic circuits
subject keywordslogic testing
subject keywordsrandom sequences
subject keywordstiming circuits
subject keywordstiming jitter
subject keywordsPBTI induced random timing jitter
subject keywordsbias temperature instability
subject keywordscircuit speed random logic
subject keywordsdevice level reliability data
subject keywordsdevice level testing
subject keywordseye diagram approach
subject keywordspseudorandom bit sequence
subject keywordsreal random logic circuits
subject keywordsreal world digital logic circuits
subject keywordsCurrent measurement
subject keywordsDegradation
subject keywordsJitter
subject keywordsLogic gates
subject keywordsStress
subject keywordsStress measurement
subject keywordsTiming
subject keywordsJitter
subject keywordspositive bias temperature instability (PBTI)
subject keywordspseudorandom bit
identifier doi10.1109/TED.2014.2357675
journal titleElectron Devices, IEEE Transactions on
journal volume61
journal issue11
filesize1304071
citations0


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