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Corrosion Studies on Gold-Plated Electrical Contacts

contributor authorMeyyappan, Karumbu
contributor authorMurtagian, Gregorio
contributor authorKurella, Anil
contributor authorPathangey, Balu
contributor authorMcAllister, Alan
contributor authorParupalli, Satish
date accessioned2020-03-13T00:13:28Z
date available2020-03-13T00:13:28Z
date issued2014
identifier issn1530-4388
identifier other6853350.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1138819?show=full
formatgeneral
languageEnglish
publisherIEEE
titleCorrosion Studies on Gold-Plated Electrical Contacts
typeJournal Paper
contenttypeMetadata Only
identifier padid8320963
subject keywordscontact resistance
subject keywordscorrosion
subject keywordselectrical contacts
subject keywordselectroless deposited coatings
subject keywordsgold alloys
subject keywordsintegrated circuit packaging
subject keywordsintegrated circuit reliability
subject keywordsnickel alloys
subject keywordspalladium alloys
subject keywordsENIG + EG alternative
subject keywordsNi-Pd-Au
subject keywordsalternative plating
subject keywordscontact resistance degradation
subject keywordselectrical connector
subject keywordsgold plated electrical contact corrosion
subject keywordslong term reliability
subject keywordsmicroelectronic package substrate
subject keywordsplating process
subject keywordsContact resistance
subject keywordsCorrosion
subject keywordsGold
subject keywordsNickel
subject keywordsResistance
subject keywordsSockets
subject keywordsSubstrates
subject keywordsMFG
identifier doi10.1109/TDMR.2014.2333758
journal titleDevice and Materials Reliability, IEEE Transactions on
journal volume14
journal issue3
filesize2032417
citations1


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