PLL-Assisted Timing Circuit for Accurate TSV Leakage Binning
Publisher:
Year
: 2014DOI: 10.1109/MDAT.2014.2335152
Keyword(s): integrated circuit manufacture,integrated circuit testing,phase locked loops,three-dimensional integrated circuits,timing circuits,PLL-assisted timing circuit,fault leakage,process-insensitive TSV leakage binning capability,production-worthy manufacturing process,through silicon vias technology,Delays,Generators,Leakage currents,Phase locked loops,Synchronization,Through-silicon vias,Timing
Collections
:
-
Statistics
PLL-Assisted Timing Circuit for Accurate TSV Leakage Binning
Show full item record
| contributor author | Shi-Yu Huang | |
| contributor author | Li-Ren Huang | |
| date accessioned | 2020-03-13T00:11:59Z | |
| date available | 2020-03-13T00:11:59Z | |
| date issued | 2014 | |
| identifier issn | 2168-2356 | |
| identifier other | 6847684.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1137947?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | PLL-Assisted Timing Circuit for Accurate TSV Leakage Binning | |
| type | Journal Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8319935 | |
| subject keywords | integrated circuit manufacture | |
| subject keywords | integrated circuit testing | |
| subject keywords | phase locked loops | |
| subject keywords | three-dimensional integrated circuits | |
| subject keywords | timing circuits | |
| subject keywords | PLL-assisted timing circuit | |
| subject keywords | fault leakage | |
| subject keywords | process-insensitive TSV leakage binning capability | |
| subject keywords | production-worthy manufacturing process | |
| subject keywords | through silicon vias technology | |
| subject keywords | Delays | |
| subject keywords | Generators | |
| subject keywords | Leakage currents | |
| subject keywords | Phase locked loops | |
| subject keywords | Synchronization | |
| subject keywords | Through-silicon vias | |
| subject keywords | Timing | |
| identifier doi | 10.1109/MDAT.2014.2335152 | |
| journal title | Design & Test, IEEE | |
| journal volume | 31 | |
| journal issue | 4 | |
| filesize | 813358 | |
| citations | 0 |