PLL-Assisted Timing Circuit for Accurate TSV Leakage Binning

نویسنده:
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ناشر:
سال
: 2014
شناسه الکترونیک: 10.1109/MDAT.2014.2335152
کلیدواژه(گان): integrated circuit manufacture,integrated circuit testing,phase locked loops,three-dimensional integrated circuits,timing circuits,PLL-assisted timing circuit,fault leakage,process-insensitive TSV leakage binning capability,production-worthy manufacturing process,through silicon vias technology,Delays,Generators,Leakage currents,Phase locked loops,Synchronization,Through-silicon vias,Timing
کالکشن :
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