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Analysis of disease association and susceptibility for SNP data using emotional neural networks

contributor authorXiao Wang , Qinke Peng , Tao Zhong
date accessioned2020-03-12T23:23:47Z
date available2020-03-12T23:23:47Z
date issued2014
identifier other6889423.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1109970?show=full
formatgeneral
languageEnglish
publisherIEEE
titleAnalysis of disease association and susceptibility for SNP data using emotional neural networks
typeConference Paper
contenttypeMetadata Only
identifier padid8278636
subject keywordsintegrated circuit design
subject keywordsintegrated circuit modelling
subject keywordsintegrated circuit reliability
subject keywordsnegative bias temperature instability
subject keywordsEldo UDRM
subject keywordsNBTI induced threshold voltage drift
subject keywordsarbitrary stress waveform
subject keywordscircuit design
subject keywordscommercial simulator
subject keywordsdeterministic compact model
subject keywordsparametric instability
subject keywordsperiodic stress waveform
subject keywordsrecovery simulation
subject keywordsreversible parametric drift
subject keywordsIntegrated circuit modeling
subject keywordsLogic gates
subject keywordsStress
subject keywordsStress measurement
subject keywordsTemperature measurement
subject keywordsThreshold voltage
subject keywordsVoltage measure
identifier doi10.1109/ESSDERC.2014.6948812
journal titleeural Networks (IJCNN), 2014 International Joint Conference on
filesize3799269
citations0


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