Analysis of disease association and susceptibility for SNP data using emotional neural networks
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: 2014شناسه الکترونیک: 10.1109/ESSDERC.2014.6948812
کلیدواژه(گان): integrated circuit design,integrated circuit modelling,integrated circuit reliability,negative bias temperature instability,Eldo UDRM,NBTI induced threshold voltage drift,arbitrary stress waveform,circuit design,commercial simulator,deterministic compact model,parametric instability,periodic stress waveform,recovery simulation,reversible parametric drift,Integrated circuit modeling,Logic gates,Stress,Stress measurement,Temperature measurement,Threshold voltage,Voltage measure
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Analysis of disease association and susceptibility for SNP data using emotional neural networks
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| contributor author | Xiao Wang , Qinke Peng , Tao Zhong | |
| date accessioned | 2020-03-12T23:23:47Z | |
| date available | 2020-03-12T23:23:47Z | |
| date issued | 2014 | |
| identifier other | 6889423.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1109970 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Analysis of disease association and susceptibility for SNP data using emotional neural networks | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8278636 | |
| subject keywords | integrated circuit design | |
| subject keywords | integrated circuit modelling | |
| subject keywords | integrated circuit reliability | |
| subject keywords | negative bias temperature instability | |
| subject keywords | Eldo UDRM | |
| subject keywords | NBTI induced threshold voltage drift | |
| subject keywords | arbitrary stress waveform | |
| subject keywords | circuit design | |
| subject keywords | commercial simulator | |
| subject keywords | deterministic compact model | |
| subject keywords | parametric instability | |
| subject keywords | periodic stress waveform | |
| subject keywords | recovery simulation | |
| subject keywords | reversible parametric drift | |
| subject keywords | Integrated circuit modeling | |
| subject keywords | Logic gates | |
| subject keywords | Stress | |
| subject keywords | Stress measurement | |
| subject keywords | Temperature measurement | |
| subject keywords | Threshold voltage | |
| subject keywords | Voltage measure | |
| identifier doi | 10.1109/ESSDERC.2014.6948812 | |
| journal title | eural Networks (IJCNN), 2014 International Joint Conference on | |
| filesize | 3799269 | |
| citations | 0 |