Architectural pattern for the definition of eLearning ecosystems based on Open Source developments
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سال
: 2014شناسه الکترونیک: 10.1109/IPFA.2014.6898170
کلیدواژه(گان): computerised tomography,n copper,n integrated circuit metallisation,n power amplifiers,n sputter etching,n three-dimensional integrated circuits,n tungsten,n Cu,n TSV etch process,n TSV metallization process,n W,n X-ray computed tomography,n copper TSV,n edge exclusion region,n power amplifiers,n stacked memory,n through silicon vias imaging,n tungsten TSV,n Computed tomography,n Image edge detection,n Power amplifiers,n Silicon
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Architectural pattern for the definition of eLearning ecosystems based on Open Source developments
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contributor author | Garcia-Holgado, A. | |
contributor author | Garcia-Peñ | |
contributor author | alvo, F.J. | |
date accessioned | 2020-03-12T22:38:26Z | |
date available | 2020-03-12T22:38:26Z | |
date issued | 2014 | |
identifier other | 7017711.pdf | |
identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1089639 | |
format | general | |
language | English | |
publisher | IEEE | |
title | Architectural pattern for the definition of eLearning ecosystems based on Open Source developments | |
type | Conference Paper | |
contenttype | Metadata Only | |
identifier padid | 8227896 | |
subject keywords | computerised tomography | |
subject keywords | n copper | |
subject keywords | n integrated circuit metallisation | |
subject keywords | n power amplifiers | |
subject keywords | n sputter etching | |
subject keywords | n three-dimensional integrated circuits | |
subject keywords | n tungsten | |
subject keywords | n Cu | |
subject keywords | n TSV etch process | |
subject keywords | n TSV metallization process | |
subject keywords | n W | |
subject keywords | n X-ray computed tomography | |
subject keywords | n copper TSV | |
subject keywords | n edge exclusion region | |
subject keywords | n power amplifiers | |
subject keywords | n stacked memory | |
subject keywords | n through silicon vias imaging | |
subject keywords | n tungsten TSV | |
subject keywords | n Computed tomography | |
subject keywords | n Image edge detection | |
subject keywords | n Power amplifiers | |
subject keywords | n Silicon | |
identifier doi | 10.1109/IPFA.2014.6898170 | |
journal title | omputers in Education (SIIE), 2014 International Symposium on | |
filesize | 829804 | |
citations | 0 |