Investigation of defects in GaN HFET structures by electroluminescence
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Year
: 2014DOI: 10.1109/RADAR.2014.6875775
Keyword(s): radar imaging,n Snell law,n back projection imaging,n fast compensation algorithm,n fast wall compensation algorithm,n focusing delay,n image defocusing,n multiple wall hidden target,n refraction point,n target position,n through-wall radar imaging,n Antennas,n Delays,n Electromagnetic scattering,n Focusing,n Mathematical model,n Radar imaging
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Investigation of defects in GaN HFET structures by electroluminescence
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| date accessioned | 2020-03-12T22:14:15Z | |
| date available | 2020-03-12T22:14:15Z | |
| date issued | 2014 | |
| identifier other | 6998662.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1075992?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Investigation of defects in GaN HFET structures by electroluminescence | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8212183 | |
| subject keywords | radar imaging | |
| subject keywords | n Snell law | |
| subject keywords | n back projection imaging | |
| subject keywords | n fast compensation algorithm | |
| subject keywords | n fast wall compensation algorithm | |
| subject keywords | n focusing delay | |
| subject keywords | n image defocusing | |
| subject keywords | n multiple wall hidden target | |
| subject keywords | n refraction point | |
| subject keywords | n target position | |
| subject keywords | n through-wall radar imaging | |
| subject keywords | n Antennas | |
| subject keywords | n Delays | |
| subject keywords | n Electromagnetic scattering | |
| subject keywords | n Focusing | |
| subject keywords | n Mathematical model | |
| subject keywords | n Radar imaging | |
| identifier doi | 10.1109/RADAR.2014.6875775 | |
| journal title | dvanced Semiconductor Devices & Microsystems (ASDAM), 2014 10th International Conference on | |
| filesize | 221429 | |
| citations | 0 |