Investigation of defects in GaN HFET structures by electroluminescence

: 2014

یو آر آی: https://libsearch.um.ac.ir:443/fum/handle/fum/1075992

کالکشن :

date accessioned	2020-03-12T22:14:15Z
date available	2020-03-12T22:14:15Z
date issued	2014
identifier other	6998662.pdf
identifier uri	https://libsearch.um.ac.ir:443/fum/handle/fum/1075992
format	general
language	English
publisher	IEEE
title	Investigation of defects in GaN HFET structures by electroluminescence
type	Conference Paper
contenttype	Metadata Only
identifier padid	8212183
subject keywords	radar imaging
subject keywords	n Snell law
subject keywords	n back projection imaging
subject keywords	n fast compensation algorithm
subject keywords	n fast wall compensation algorithm
subject keywords	n focusing delay
subject keywords	n image defocusing
subject keywords	n multiple wall hidden target
subject keywords	n refraction point
subject keywords	n target position
subject keywords	n through-wall radar imaging
subject keywords	n Antennas
subject keywords	n Delays
subject keywords	n Electromagnetic scattering
subject keywords	n Focusing
subject keywords	n Mathematical model
subject keywords	n Radar imaging
identifier doi	10.1109/RADAR.2014.6875775
journal title	dvanced Semiconductor Devices & Microsystems (ASDAM), 2014 10th International Conference on
filesize	221429
citations	0

Show full item record