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Soft biometrics for subject identification using clothing attributes

contributor authorJaha, Emad Sami
contributor authorNixon, Mark S.
date accessioned2020-03-12T22:09:59Z
date available2020-03-12T22:09:59Z
date issued2014
identifier other6996278.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1073761?locale-attribute=fa&show=full
formatgeneral
languageEnglish
publisherIEEE
titleSoft biometrics for subject identification using clothing attributes
typeConference Paper
contenttypeMetadata Only
identifier padid8209885
subject keywordsIII-V semiconductors
subject keywordsn MOSFET
subject keywordsn gallium arsenide
subject keywordsn indium compounds
subject keywordsn tunnelling
subject keywordsn BTBT
subject keywordsn DIBL
subject keywordsn III-V FETs
subject keywordsn In<
subject keywordssub>
subject keywords0.53<
subject keywords/sub>
subject keywordsGa<
subject keywordssub>
subject keywords0.47<
subject keywords/sub>
subject keywordsAs
subject keywordsn N+ source-drain
subject keywordsn SS
subject keywordsn band-to-band tunneling
subject keywordsn channel material
subject keywordsn channel-drain junction
subject keywordsn depletion region
subject keywordsn drain-induced barrier lowering
subject keywordsn electron transport properties
subject keywordsn high drain-field region
subject keywordsn narrow bandgap
subject keywordsn off-state leakage
subject keywordsn on-state characteristics
identifier doi10.1109/DRC.2014.6872378
journal titleiometrics (IJCB), 2014 IEEE International Joint Conference on
filesize745738
citations0


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