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Iris recognition using block local binary patterns and relational measures

contributor authorNigam, Aditya
contributor authorKrishna, Vamshi
contributor authorBendale, Amit
contributor authorGupta, Phalguni
date accessioned2020-03-12T22:09:57Z
date available2020-03-12T22:09:57Z
date issued2014
identifier other6996263.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1073743?show=full
formatgeneral
languageEnglish
publisherIEEE
titleIris recognition using block local binary patterns and relational measures
typeConference Paper
contenttypeMetadata Only
identifier padid8209867
subject keywordscontact resistance
subject keywordsn field effect transistors
subject keywordsn gold
subject keywordsn molybdenum compounds
subject keywordsn semiconductor device reliability
subject keywordsn 2D field effect transistors
subject keywordsn Au
subject keywordsn MoS<
subject keywordssub>
subject keywords2<
subject keywords/sub>
subject keywordsn contact resistance
subject keywordsn deposition conditions
subject keywordsn key limiting factor
subject keywordsn lateral access resistance
subject keywordsn metal interface
subject keywordsn two-dimensional FET
subject keywordsn Charge carrier density
subject keywordsn Density measurement
subject keywordsn Electrodes
subject keywordsn Field effect transistors
subject keywordsn Gold
subject keywordsn Nickel
subject keywordsn Resistance
identifier doi10.1109/DRC.2014.6872363
journal titleiometrics (IJCB), 2014 IEEE International Joint Conference on
filesize1580994
citations3


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