Iris recognition using block local binary patterns and relational measures
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Year
: 2014DOI: 10.1109/DRC.2014.6872363
Keyword(s): contact resistance,n field effect transistors,n gold,n molybdenum compounds,n semiconductor device reliability,n 2D field effect transistors,n Au,n MoS<,sub>,2<,/sub>,n contact resistance,n deposition conditions,n key limiting factor,n lateral access resistance,n metal interface,n two-dimensional FET,n Charge carrier density,n Density measurement,n Electrodes,n Field effect transistors,n Gold,n Nickel,n Resistance
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Iris recognition using block local binary patterns and relational measures
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| contributor author | Nigam, Aditya | |
| contributor author | Krishna, Vamshi | |
| contributor author | Bendale, Amit | |
| contributor author | Gupta, Phalguni | |
| date accessioned | 2020-03-12T22:09:57Z | |
| date available | 2020-03-12T22:09:57Z | |
| date issued | 2014 | |
| identifier other | 6996263.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1073743?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Iris recognition using block local binary patterns and relational measures | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8209867 | |
| subject keywords | contact resistance | |
| subject keywords | n field effect transistors | |
| subject keywords | n gold | |
| subject keywords | n molybdenum compounds | |
| subject keywords | n semiconductor device reliability | |
| subject keywords | n 2D field effect transistors | |
| subject keywords | n Au | |
| subject keywords | n MoS< | |
| subject keywords | sub> | |
| subject keywords | 2< | |
| subject keywords | /sub> | |
| subject keywords | n contact resistance | |
| subject keywords | n deposition conditions | |
| subject keywords | n key limiting factor | |
| subject keywords | n lateral access resistance | |
| subject keywords | n metal interface | |
| subject keywords | n two-dimensional FET | |
| subject keywords | n Charge carrier density | |
| subject keywords | n Density measurement | |
| subject keywords | n Electrodes | |
| subject keywords | n Field effect transistors | |
| subject keywords | n Gold | |
| subject keywords | n Nickel | |
| subject keywords | n Resistance | |
| identifier doi | 10.1109/DRC.2014.6872363 | |
| journal title | iometrics (IJCB), 2014 IEEE International Joint Conference on | |
| filesize | 1580994 | |
| citations | 3 |