| contributor author | Martins, Fabio Passos | |
| contributor author | Pinto Azevedo, Julio Arlindo | |
| date accessioned | 2020-03-12T21:58:57Z | |
| date available | 2020-03-12T21:58:57Z | |
| date issued | 2014 | |
| identifier other | 6968910.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1067304?show=full | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | A evolução do conceito de segurança intrínseca emáreas classificadas | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8201880 | |
| subject keywords | MOSFET circuits | |
| subject keywords | n SRAM chips | |
| subject keywords | n circuit complexity | |
| subject keywords | n circuit simulation | |
| subject keywords | n electronic design automation | |
| subject keywords | n integrated circuit modelling | |
| subject keywords | n integrated circuit noise | |
| subject keywords | n nanoelectronics | |
| subject keywords | n random noise | |
| subject keywords | n AC effects | |
| subject keywords | n BSIM | |
| subject keywords | n RO | |
| subject keywords | n RTN | |
| subject keywords | n SRAM | |
| subject keywords | n circuit simulation methodology | |
| subject keywords | n compact modeling | |
| subject keywords | n digital circuits | |
| subject keywords | n industry-standard EDA tools | |
| subject keywords | n nanoscale MOSFETs | |
| subject keywords | n random telegraph noise | |
| subject keywords | n stochastic property | |
| subject keywords | n Delays | |
| subject keywords | n Energy states | |
| subject keywords | n Frequ | |
| identifier doi | 10.1109/VLSI-TSA.2014.6839681 | |
| journal title | etroleum and Chemical Industry Conference - Brasil (PCIC Brasil), 2014 IEEE | |
| filesize | 3493235 | |
| citations | 0 | |