A evolução do conceito de segurança intrínseca emáreas classificadas
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: 2014DOI: 10.1109/VLSI-TSA.2014.6839681
Keyword(s): MOSFET circuits,n SRAM chips,n circuit complexity,n circuit simulation,n electronic design automation,n integrated circuit modelling,n integrated circuit noise,n nanoelectronics,n random noise,n AC effects,n BSIM,n RO,n RTN,n SRAM,n circuit simulation methodology,n compact modeling,n digital circuits,n industry-standard EDA tools,n nanoscale MOSFETs,n random telegraph noise,n stochastic property,n Delays,n Energy states,n Frequ
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A evolução do conceito de segurança intrínseca emáreas classificadas
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| contributor author | Martins, Fabio Passos | |
| contributor author | Pinto Azevedo, Julio Arlindo | |
| date accessioned | 2020-03-12T21:58:57Z | |
| date available | 2020-03-12T21:58:57Z | |
| date issued | 2014 | |
| identifier other | 6968910.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1067304?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | A evolução do conceito de segurança intrínseca emáreas classificadas | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8201880 | |
| subject keywords | MOSFET circuits | |
| subject keywords | n SRAM chips | |
| subject keywords | n circuit complexity | |
| subject keywords | n circuit simulation | |
| subject keywords | n electronic design automation | |
| subject keywords | n integrated circuit modelling | |
| subject keywords | n integrated circuit noise | |
| subject keywords | n nanoelectronics | |
| subject keywords | n random noise | |
| subject keywords | n AC effects | |
| subject keywords | n BSIM | |
| subject keywords | n RO | |
| subject keywords | n RTN | |
| subject keywords | n SRAM | |
| subject keywords | n circuit simulation methodology | |
| subject keywords | n compact modeling | |
| subject keywords | n digital circuits | |
| subject keywords | n industry-standard EDA tools | |
| subject keywords | n nanoscale MOSFETs | |
| subject keywords | n random telegraph noise | |
| subject keywords | n stochastic property | |
| subject keywords | n Delays | |
| subject keywords | n Energy states | |
| subject keywords | n Frequ | |
| identifier doi | 10.1109/VLSI-TSA.2014.6839681 | |
| journal title | etroleum and Chemical Industry Conference - Brasil (PCIC Brasil), 2014 IEEE | |
| filesize | 3493235 | |
| citations | 0 |