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ناشر:
سال
: 2014
شناسه الکترونیک: 10.1109/VLSI-TSA.2014.6839642
کلیدواژه(گان): VLSI,n embedded systems,n integrated circuit reliability,n integrated circuit testing,n low-power electronics,n thermal engineering,n VLSI circuit testability,n automotive electronics,n medical applications,n power-efficiency,n reliable embedded systems,n safety-critical areas,n silicon technology scaling,n test processes,n thermal impacts,n Clocks,n Embedded systems,n Integrated circuit reliability,n Power demand,n Temperature sensors
کالکشن :
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