Spine
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: 2014DOI: 10.1109/VLSI-TSA.2014.6839642
Keyword(s): VLSI,n embedded systems,n integrated circuit reliability,n integrated circuit testing,n low-power electronics,n thermal engineering,n VLSI circuit testability,n automotive electronics,n medical applications,n power-efficiency,n reliable embedded systems,n safety-critical areas,n silicon technology scaling,n test processes,n thermal impacts,n Clocks,n Embedded systems,n Integrated circuit reliability,n Power demand,n Temperature sensors
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| date accessioned | 2020-03-12T21:58:53Z | |
| date available | 2020-03-12T21:58:53Z | |
| date issued | 2014 | |
| identifier other | 6968871.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1067265?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Spine | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8201826 | |
| subject keywords | VLSI | |
| subject keywords | n embedded systems | |
| subject keywords | n integrated circuit reliability | |
| subject keywords | n integrated circuit testing | |
| subject keywords | n low-power electronics | |
| subject keywords | n thermal engineering | |
| subject keywords | n VLSI circuit testability | |
| subject keywords | n automotive electronics | |
| subject keywords | n medical applications | |
| subject keywords | n power-efficiency | |
| subject keywords | n reliable embedded systems | |
| subject keywords | n safety-critical areas | |
| subject keywords | n silicon technology scaling | |
| subject keywords | n test processes | |
| subject keywords | n thermal impacts | |
| subject keywords | n Clocks | |
| subject keywords | n Embedded systems | |
| subject keywords | n Integrated circuit reliability | |
| subject keywords | n Power demand | |
| subject keywords | n Temperature sensors | |
| identifier doi | 10.1109/VLSI-TSA.2014.6839642 | |
| journal title | etroleum and Chemical Industry Conference - Brasil (PCIC Brasil), 2014 IEEE | |
| filesize | 19371 | |
| citations | 0 |