date accessioned | 2020-03-12T21:56:54Z | |
date available | 2020-03-12T21:56:54Z | |
date issued | 2014 | |
identifier other | 6966985.pdf | |
identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1066129?show=full | |
format | general | |
language | English | |
publisher | IEEE | |
title | [Copyright notice] | |
type | Conference Paper | |
contenttype | Metadata Only | |
identifier padid | 8199883 | |
subject keywords | ionisation | |
subject keywords | n memristors | |
subject keywords | n radiation hardening (electronics) | |
subject keywords | n RRAM component | |
subject keywords | n incident energetic ion | |
subject keywords | n ionizing dose | |
subject keywords | n metal oxide-based memristor | |
subject keywords | n radiation-induced displacement damage | |
subject keywords | n resistive random access memory component | |
subject keywords | n Ions | |
subject keywords | n Memristors | |
subject keywords | n Metals | |
subject keywords | n Protons | |
subject keywords | n Radiation effects | |
subject keywords | n Silicon | |
identifier doi | 10.1109/AERO.2014.6836479 | |
journal title | esign and Technology in Electronic Packaging (SIITME), 2014 IEEE 20th International Symposium for | |
filesize | 82053 | |
citations | 0 | |