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Device and process modeling: 20 Years at Intel's other fab

contributor authorStettler, M.A.
date accessioned2020-03-12T21:15:28Z
date available2020-03-12T21:15:28Z
date issued2014
identifier other6931551.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1042510?show=full
formatgeneral
languageEnglish
publisherIEEE
titleDevice and process modeling: 20 Years at Intel's other fab
typeConference Paper
contenttypeMetadata Only
identifier padid8170217
subject keywordsCalibration
subject keywordsPower measurement
subject keywordsRadio frequency
subject keywordsResistors
subject keywordsTemperature measurement
subject keywordsTemperature sensors
subject keywordsTransmission line measurements
subject keywordsRF calorimeter
subject keywordshigh-precision
subject keywordspower calibration
subject keywordstemperature sensor
subject keywordstemperature-voltage convering
identifier doi10.1109/APCAP.2014.6992638
journal titleimulation of Semiconductor Processes and Devices (SISPAD), 2014 International Conference on
filesize962228
citations0


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