Device and process modeling: 20 Years at Intel's other fab
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: 2014شناسه الکترونیک: 10.1109/APCAP.2014.6992638
کلیدواژه(گان): Calibration,Power measurement,Radio frequency,Resistors,Temperature measurement,Temperature sensors,Transmission line measurements,RF calorimeter,high-precision,power calibration,temperature sensor,temperature-voltage convering
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Device and process modeling: 20 Years at Intel's other fab
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| contributor author | Stettler, M.A. | |
| date accessioned | 2020-03-12T21:15:28Z | |
| date available | 2020-03-12T21:15:28Z | |
| date issued | 2014 | |
| identifier other | 6931551.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1042510?locale-attribute=fa | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Device and process modeling: 20 Years at Intel's other fab | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8170217 | |
| subject keywords | Calibration | |
| subject keywords | Power measurement | |
| subject keywords | Radio frequency | |
| subject keywords | Resistors | |
| subject keywords | Temperature measurement | |
| subject keywords | Temperature sensors | |
| subject keywords | Transmission line measurements | |
| subject keywords | RF calorimeter | |
| subject keywords | high-precision | |
| subject keywords | power calibration | |
| subject keywords | temperature sensor | |
| subject keywords | temperature-voltage convering | |
| identifier doi | 10.1109/APCAP.2014.6992638 | |
| journal title | imulation of Semiconductor Processes and Devices (SISPAD), 2014 International Conference on | |
| filesize | 962228 | |
| citations | 0 |