Effect of material choice on spalling fracture parameters to exfoliate thin PV devices
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: 2014DOI: 10.1109/IMCCC.2014.148
Keyword(s): Analytical models,Bayes methods,Computer network reliability,Fault trees,Reliability,Safety,Uncertainty,Bayesian Network,Failure Mode and Effect Analysis (FMEA),Fault Tree Analysis (FTA),Reliability,Structure Matrix
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Effect of material choice on spalling fracture parameters to exfoliate thin PV devices
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| contributor author | Sweet, C.A. | |
| contributor author | Simon, J.D. | |
| contributor author | Young, D.L. | |
| contributor author | Ptak, A.J. | |
| contributor author | Packard, C.E. | |
| date accessioned | 2020-03-12T21:06:31Z | |
| date available | 2020-03-12T21:06:31Z | |
| date issued | 2014 | |
| identifier other | 6925127.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1037237 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Effect of material choice on spalling fracture parameters to exfoliate thin PV devices | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8163524 | |
| subject keywords | Analytical models | |
| subject keywords | Bayes methods | |
| subject keywords | Computer network reliability | |
| subject keywords | Fault trees | |
| subject keywords | Reliability | |
| subject keywords | Safety | |
| subject keywords | Uncertainty | |
| subject keywords | Bayesian Network | |
| subject keywords | Failure Mode and Effect Analysis (FMEA) | |
| subject keywords | Fault Tree Analysis (FTA) | |
| subject keywords | Reliability | |
| subject keywords | Structure Matrix | |
| identifier doi | 10.1109/IMCCC.2014.148 | |
| journal title | hotovoltaic Specialist Conference (PVSC), 2014 IEEE 40th | |
| filesize | 241110 | |
| citations | 0 |