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Conference flyer

date accessioned2020-03-12T21:05:50Z
date available2020-03-12T21:05:50Z
date issued2014
identifier other6924502.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/1036872?show=full
formatgeneral
languageEnglish
publisherIEEE
titleConference flyer
typeConference Paper
contenttypeMetadata Only
identifier padid8163108
subject keywordsanalogue-digital conversion
subject keywordsbenchmark testing
subject keywordselectromagnetic compatibility
subject keywordsimmunity testing
subject keywordsintegrated circuit measurement
subject keywordsintegrated circuit testing
subject keywordsradiofrequency integrated circuits
subject keywordsADC
subject keywordsDPI method
subject keywordsRFIP method
subject keywordsVNA
subject keywordsanalog to digital converter
subject keywordsdirect power injection method
subject keywordsimmunity measurement technique
subject keywordsimmunity parameters calculation model
subject keywordsintegrated circuits immunity
subject keywordsresistive RF injection probe test method
subject keywordsvector network analyzer
subject keywordsvirtual test bench
subject keywordsImmunity testing
subject keywordsImpeda
identifier doi10.1109/EMCEurope.2014.6930992
journal titleptical MEMS and Nanophotonics (OMN), 2014 International Conference on
filesize1185739
citations0


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