Experimental study of programming saturation in low-coupling planar high-k/metal gate nand flash memory cells using a dedicated test structure
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: 2014DOI: 10.1109/INDICON.2014.7030528
Keyword(s): Batteries,Generators,Genetic algorithms,Mathematical model,Optimization,Radiation effects,Reliability,Annual Cost Of the System,Genetic Algorithm,Loss Of Load Probability,Optimization
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Experimental study of programming saturation in low-coupling planar high-k/metal gate nand flash memory cells using a dedicated test structure
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| date accessioned | 2020-03-12T20:04:26Z | |
| date available | 2020-03-12T20:04:26Z | |
| date issued | 2014 | |
| identifier other | 6849365.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1000782 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Experimental study of programming saturation in low-coupling planar high-k/metal gate nand flash memory cells using a dedicated test structure | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8121546 | |
| subject keywords | Batteries | |
| subject keywords | Generators | |
| subject keywords | Genetic algorithms | |
| subject keywords | Mathematical model | |
| subject keywords | Optimization | |
| subject keywords | Radiation effects | |
| subject keywords | Reliability | |
| subject keywords | Annual Cost Of the System | |
| subject keywords | Genetic Algorithm | |
| subject keywords | Loss Of Load Probability | |
| subject keywords | Optimization | |
| identifier doi | 10.1109/INDICON.2014.7030528 | |
| journal title | emory Workshop (IMW), 2014 IEEE 6th International | |
| filesize | 863829 | |
| citations | 0 | |
| contributor rawauthor | Blomme, P. , Chi Lim Tan , Souriau, L. , Versluijs, J. , Van den bosch, G. , Van Houdt, J. |