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    Editorial 

    Type: Journal Paper
    Author : Schreurs, Dominique; Lin, James
    Publisher: IEEE
    Year: 2014

    Editorial 

    Type: Journal Paper
    Author : Schreurs, Dominique; Lin, James
    Publisher: IEEE
    Year: 2014

    Editorial 

    Type: Journal Paper
    Author : Lin, James; Schreurs, Dominique
    Publisher: IEEE
    Year: 2014

    Efficient Generation of <formula formulatype="inline"> <img src="/images/tex/21478.gif" alt="{\\rm X}"> </formula>-Parameters Transistor Models by Sequential Sampling 

    Type: Journal Paper
    Author : Barmuta, Pawel; Ferranti, Francesco; Lewandowski, Andreas; Knockaert, Luc; Schreurs, Dominique
    Publisher: IEEE
    Year: 2014

    2013 MTT-S Graduate Student Fellowship Awards [Education News] 

    Type: Journal Paper
    Author : Crupi, Giovanni; Kaul, Roger; Li, Cong; Schreurs, Dominique
    Publisher: IEEE
    Year: 2014

    Characterization of Intermodulation and Memory Effects Using Offset Multisine Excitation 

    Type: Journal Paper
    Author : Farsi, S.; Draxler, Paul J.; Gheidi, H.; Nauwelaers, Bart K. J. C.; Asbeck, P.; Schreurs, Dominique
    Publisher: IEEE
    Year: 2014

    Nonlinear behavioral models of HEMTs using response surface methodology 

    Type: Conference Paper
    Author : Barmuta, Pawel; Gibiino, Gian Piero; Ferranti, Francesco; Lewandowski, Arkadiusz; Schreurs, Dominique
    Publisher: IEEE
    Year: 2014

    GaN HEMT model extraction based on dynamic-bias measurements 

    Type: Conference Paper
    Author : Vadala, Valeria; Raffo, Antonio; Vannini, Giorgio; Avolio, Gustavo; Schreurs, Dominique M.M.-P.
    Publisher: IEEE
    Year: 2014

    Mixer-like modeling with dynamic baseband characterization for supply-modulated PAs 

    Type: Conference Paper
    Author : Gibiino, Gian Piero; Avolio, Gustavo; Schreurs, Dominique; Santarelli, Alberto; Filicori, Fabio
    Publisher: IEEE
    Year: 2014

    Pulsed NVNA measurements for dynamic characterization of RF PAs 

    Type: Conference Paper
    Author : Gibiino, Gian Piero; Tafuri, Felice Francesco; Nielsen, Troels S.; Schreurs, Dominique; Santarelli, Alberto
    Publisher: IEEE
    Year: 2014
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