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نمایش تعداد 1-4 از 4

Modeling and extraction technique for parasitic resistances in MOSFETs Combining DC I–V and low frequency C–V measurement

نوع: Journal Paper

نویسنده : Ja Sun Shin; Hagyoul Bae; Euiyoun Hong; Jaeman Jang; Daeyoun Yun; Jieun Lee; Dae Hwan Kim; Dong Myong Kim

ناشر: Elsevier Science

سال: 2012

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Investigation of Self-Heating Effects in Gate-All-Around MOSFETs With Vertically Stacked Multiple Silicon Nanowire Channels

نوع: Journal Paper

نویسنده : Jun-Young Park; Byung-Hyun Lee; Ki Soo Chang; Dong Uk Kim; Chanbae Jeong; Choong-Ki Kim; Hagyoul Bae; Yang-Kyu Choi

سال: 2017

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Direct Observation of a Carbon Filament in Water-Resistant Organic Memory

نوع: Journal Paper

نویسنده : Byung-Hyun Lee; Hagyoul Bae; Hyejeong Seong; Dong-Il Lee; Hongkeun Park; Young Joo Choi; Sung-Gap Im; Sang Ouk Kim; Yang-Kyu Choi

سال: 2015

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Fully Current-Based Sub-Bandgap Optoelectronic Differential Ideality Factor Technique and Extraction of Subgap DOS in Amorphous Semiconductor TFTs

نوع: Journal Paper

نویسنده : Hagyoul Bae; Hyojoon Seo; Sungwoo Jun; Hyunjun Choi; Jaeyeop Ahn; Junseok Hwang; Jungmin Lee; Oh, Sung-Min; Jong-Uk Bae; Sung-Jin Choi; Dae Hwan Kim; Dong Myong Kim

ناشر: IEEE

سال: 2014

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Modeling and extraction technique for parasitic resistances in MOSFETs Combining DC I–V and low frequency C–V measurement

Investigation of Self-Heating Effects in Gate-All-Around MOSFETs With Vertically Stacked Multiple Silicon Nanowire Channels

Direct Observation of a Carbon Filament in Water-Resistant Organic Memory

Fully Current-Based Sub-Bandgap Optoelectronic Differential Ideality Factor Technique and Extraction of Subgap DOS in Amorphous Semiconductor TFTs

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Modeling and extraction technique for parasitic resistances in MOSFETs Combining DC I–V and low frequency C–V measurement

Investigation of Self-Heating Effects in Gate-All-Around MOSFETs With Vertically Stacked Multiple Silicon Nanowire Channels

Direct Observation of a Carbon Filament in Water-Resistant Organic Memory

Fully Current-Based Sub-Bandgap Optoelectronic Differential Ideality Factor Technique and Extraction of Subgap DOS in Amorphous Semiconductor TFTs