Fully Current-Based Sub-Bandgap Optoelectronic Differential Ideality Factor Technique and Extraction of Subgap DOS in Amorphous Semiconductor TFTs
نویسنده:
, , , , , , , , , , ,ناشر:
سال
: 2014شناسه الکترونیک: 10.1109/TED.2014.2348592
کلیدواژه(گان): amorphous semiconductors,gallium compounds,indium compounds,localised states,thin film transistors,wide band gap semiconductors,zinc compounds,InGaZnO,amorphous semiconductor TFTs,dark photonic excitation condition,energy distribution,fully current-based sub-bandgap optoelectronic differential ideality factor technique,gate bias-dependent differential change,intrinsic density-of-state extraction,localized states,sub-bandgap photonic excitation condition,subgap DOS extraction,thi
کالکشن
:
-
آمار بازدید
Fully Current-Based Sub-Bandgap Optoelectronic Differential Ideality Factor Technique and Extraction of Subgap DOS in Amorphous Semiconductor TFTs
Show full item record
contributor author | Hagyoul Bae | |
contributor author | Hyojoon Seo | |
contributor author | Sungwoo Jun | |
contributor author | Hyunjun Choi | |
contributor author | Jaeyeop Ahn | |
contributor author | Junseok Hwang | |
contributor author | Jungmin Lee | |
contributor author | Oh, Sung-Min | |
contributor author | Jong-Uk Bae | |
contributor author | Sung-Jin Choi | |
contributor author | Dae Hwan Kim | |
contributor author | Dong Myong Kim | |
date accessioned | 2020-03-13T00:20:59Z | |
date available | 2020-03-13T00:20:59Z | |
date issued | 2014 | |
identifier issn | 0018-9383 | |
identifier other | 6891249.pdf | |
identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1143423 | |
format | general | |
language | English | |
publisher | IEEE | |
title | Fully Current-Based Sub-Bandgap Optoelectronic Differential Ideality Factor Technique and Extraction of Subgap DOS in Amorphous Semiconductor TFTs | |
type | Journal Paper | |
contenttype | Metadata Only | |
identifier padid | 8326040 | |
subject keywords | amorphous semiconductors | |
subject keywords | gallium compounds | |
subject keywords | indium compounds | |
subject keywords | localised states | |
subject keywords | thin film transistors | |
subject keywords | wide band gap semiconductors | |
subject keywords | zinc compounds | |
subject keywords | InGaZnO | |
subject keywords | amorphous semiconductor TFTs | |
subject keywords | dark photonic excitation condition | |
subject keywords | energy distribution | |
subject keywords | fully current-based sub-bandgap optoelectronic differential ideality factor technique | |
subject keywords | gate bias-dependent differential change | |
subject keywords | intrinsic density-of-state extraction | |
subject keywords | localized states | |
subject keywords | sub-bandgap photonic excitation condition | |
subject keywords | subgap DOS extraction | |
subject keywords | thi | |
identifier doi | 10.1109/TED.2014.2348592 | |
journal title | Electron Devices, IEEE Transactions on | |
journal volume | 61 | |
journal issue | 10 | |
filesize | 1078008 | |
citations | 0 |