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    Editorial Conference Comments by the General Chair 

    Type: Journal Paper
    Author : Ecoffet, R.
    Publisher: IEEE
    Year: 2014

    Radiation Belt Activity Indices and Solar Proton Event Alarm 

    Type: Journal Paper
    Author : Lazaro, D.; Boscher, D.; Bourdarie, S.; Sicard-Piet, A.; Rolland, G.; Ecoffet, R.; Lorfè vre, E.
    Publisher: IEEE
    Year: 2014

    Unfolding JASON-2/ICARE-NG High-Energy Particles Measurements Using a Singular Value Decomposition Approach 

    Type: Journal Paper
    Author : Maget, V.; Bourdarie, S.; Lazaro, D.; Boscher, D.; Rolland, G.; Ecoffet, R.; Lorfè vre, E.
    Publisher: IEEE
    Year: 2014

    Correlation of In-Flight Displacement Damage on the OSL Sensor With Space Environment On-Board Jason-2 Spacecraft 

    Type: Journal Paper
    Author : Bourdarie, S.; Falguere, D.; Inguimbert, C.; Deneau, C.; Vaillé , J.-R.; Lorfè vre, E.; Ecoffet, R.
    Publisher: IEEE
    Year: 2014

    In-Flight Measurements of Radiation Environment on Board the Argentinean Satellite SAC-D 

    Type: Journal Paper
    Author : Boscher, D.; Cayton, T.; Maget, V.; Bourdarie, S.; Lazaro, D.; Baldran, T.; Bourdoux, P.; Lorfevre, E.; Rolland, G.; Ecoffet, R.
    Publisher: IEEE
    Year: 2014

    Heavy Ion SEU Cross Section Calculation Based on Proton Experimental Data, and Vice Versa 

    Type: Journal Paper
    Author : Wrobel, F.; Touboul, A.D.; Pouget, V.; Dilillo, L.; Ecoffet, R.; Lorfevre, E.; Bezerra, F.; Brugger, M.; Saigne, F.
    Publisher: IEEE
    Year: 2014

    Experimental Characterization and Simulation of Electron-Induced SEU in 45-nm CMOS Technology 

    Type: Journal Paper
    Author : Samaras, A.; Pourrouquet, P.; Sukhaseum, N.; Gouyet, L.; Vandevelde, B.; Chatry, N.; Ecoffet, R.; Bezerra, F.; Lorfevre, E.
    Publisher: IEEE
    Year: 2014

    Study of a Thermal Annealing Approach for Very High Total Dose Environments 

    Type: Journal Paper
    Author : Dhombres, S.; Michez, A.; Boch, J.; Saigne, F.; Beauvivre, S.; Kraehenbuehl, D.; Vaille, J.-R.; Adell, P.C.; Lorfevre, E.; Ecoffet, R.; Roig, Fabien
    Publisher: IEEE
    Year: 2014

    Impact of Neutron-Induced Displacement Damage<newline/> on the ATREE Response in LM124 <newline/>Operational Amplifier 

    Type: Journal Paper
    Author : Roig, Fabien; Dusseau, L.; Ribeiro, P.; Auriel, G.; Roche, Nicholas J.-H; Privat, A.; Vaille, J.-R.; Boch, J.; Saigne, F.; Marec, R.; Calvel, P.; Bezerra, F.; Ecoffet, R.; Azais, Bruno
    Publisher: IEEE
    Year: 2014

    The Role of Feedback Resistors and TID Effects in the ASET Response of a High Speed Current Feedback Amplifier 

    Type: Journal Paper
    Author : Roig, Fabien; Dusseau, L.; Ribeiro, P.; Auriel, G.; Roche, Nicholas J.-H; Privat, A.; Vaille, J.-R.; Boch, J.; Saigne, F.; Marec, R.; Calvel, P.; Bezerra, F.; Ecoffet, R.; Azais, Bruno
    Publisher: IEEE
    Year: 2014
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