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Estimation of multi-conductor powerline cable parameters for the modelling of transfer characteristics

Type: Journal Paper

Author : Linyu Wang; Avolio, Gustavo; Deconinck, Geert; Van Lil, Emmanuel; Loi Lei Lai

Publisher: IET

Year: 2014

GaN HEMT model extraction based on dynamic-bias measurements

Type: Conference Paper

Author : Vadala, Valeria; Raffo, Antonio; Vannini, Giorgio; Avolio, Gustavo; Schreurs, Dominique M.M.-P.

Publisher: IEEE

Year: 2014

Mixer-like modeling with dynamic baseband characterization for supply-modulated PAs

Type: Conference Paper

Author : Gibiino, Gian Piero; Avolio, Gustavo; Schreurs, Dominique; Santarelli, Alberto; Filicori, Fabio

Publisher: IEEE

Year: 2014

An Extensive Experimental Analysis of the Kink Effects in <formula formulatype="inline"> <img src="/images/tex/21377.gif" alt="{ S}_{22}"> </formula> and <formula formulatype="inline"> <img src="/images/tex/21378.gif" alt="{ h}_{21}"> </formula> for a GaN HEMT

Type: Journal Paper

Author : Crupi, Giovanni; Raffo, Antonio; Marinkovic, Zlatica; Avolio, Gustavo; Caddemi, Alina; Markovic, Vera; Vannini, Giorgio; Schreurs, Dominique M. M.-P

Publisher: IEEE

Year: 2014

Millimeter-Wave FET Nonlinear Modelling Based on the Dynamic-Bias Measurement Technique

Type: Journal Paper

Author : Avolio, Gustavo; Raffo, Antonio; Angelov, Iltcho; Vadala, Valeria; Crupi, Giovanni; Caddemi, Alina; Vannini, Giorgio; Schreurs, Dominique M. M.-P

Publisher: IEEE

Year: 2014

Small-Versus Large-Signal Extraction of Charge Models of Microwave FETs

Type: Journal Paper

Author : Avolio, Gustavo; Raffo, Antonio; Angelov, Iltcho; Crupi, Giovanni; Caddemi, Alina; Vannini, Giorgio; Schreurs, Dominique M. M.-P

Publisher: IEEE

Year: 2014

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Estimation of multi-conductor powerline cable parameters for the modelling of transfer characteristics

GaN HEMT model extraction based on dynamic-bias measurements

Mixer-like modeling with dynamic baseband characterization for supply-modulated PAs

An Extensive Experimental Analysis of the Kink Effects in <formula formulatype="inline"> <img src="/images/tex/21377.gif" alt="{ S}_{22}"> </formula> and <formula formulatype="inline"> <img src="/images/tex/21378.gif" alt="{ h}_{21}"> </formula> for a GaN HEMT

Millimeter-Wave FET Nonlinear Modelling Based on the Dynamic-Bias Measurement Technique

Small-Versus Large-Signal Extraction of Charge Models of Microwave FETs

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Estimation of multi-conductor powerline cable parameters for the modelling of transfer characteristics

GaN HEMT model extraction based on dynamic-bias measurements

Mixer-like modeling with dynamic baseband characterization for supply-modulated PAs

An Extensive Experimental Analysis of the Kink Effects in <formula formulatype="inline"> <img src="/images/tex/21377.gif" alt="{ S}_{22}"> </formula> and <formula formulatype="inline"> <img src="/images/tex/21378.gif" alt="{ h}_{21}"> </formula> for a GaN HEMT

Millimeter-Wave FET Nonlinear Modelling Based on the Dynamic-Bias Measurement Technique

Small-Versus Large-Signal Extraction of Charge Models of Microwave FETs