Search

نمایش تعداد 1-10 از 29

Securing communication in cyber-physical systems using steganography and cryptography

نوع: Conference Paper

نویسنده : Vegh, L. , Miclea, L.

ناشر: IEEE

سال: 2014

Long-Term Destructive SEE Risk and Calculations Using Multiple “Worst-Case” Events Versus Modelling

نوع: Journal Paper

نویسنده : Jiggens, Piers; Evans, Hugh; Truscott, Pete; Heynderickx, Daniel; Fan Lei; DeDonder, Erwin

ناشر: IEEE

سال: 2014

Characterization of Heavy-Ion-Induced Single-Event Effects in 65 nm Bulk CMOS ASIC Test Chips

نوع: Journal Paper

نویسنده : Chia-Hsiang Chen; Knag, Phil; Zhengya Zhang

ناشر: IEEE

سال: 2014

Determination of Single-Event Effect Application Requirements for Enhancement Mode Gallium Nitride HEMTs for Use in Power Distribution Circuits

نوع: Journal Paper

نویسنده : Scheick, Leif

ناشر: IEEE

سال: 2014

Single Event Effects in Carbon Nanotube-Based Field Effect Transistors Under Energetic Particle Radiation

نوع: Journal Paper

نویسنده : Bushmaker, Adam W.; Walker, David; Mann, Colin J.; Oklejas, Vanessa; Hopkins, Alan R.; Amer, Moh R.; Cronin, Stephen B.

ناشر: IEEE

سال: 2014

A Two-Order Increase in Robustness of Partial Redundancy Under a Radiation Stress Test by Using SDC Prediction

نوع: Journal Paper

نویسنده : Ahmed, Toufik; Jun Yao; Nakashima, Yuta

ناشر: IEEE

سال: 2014

A Dosimetry Methodology for Two-Photon Absorption Induced Single-Event Effects Measurements

نوع: Journal Paper

نویسنده : Khachatrian, Ani; Roche, Nicholas J.-H; McMorrow, Dale; Warner, Jeffrey H.; Buchner, Stephen P.; Melinger, Joseph S.

ناشر: IEEE

سال: 2014

Simulation of Light-Matter Interaction and Two-Photon Absorption Induced Charge Deposition by Ultrashort Optical Pulses in Silicon

نوع: Journal Paper

نویسنده : Hales, Joel M.; McMorrow, Dale; Roche, Nicholas J.-H; Khachatrian, Ani; Warner, Jeffrey H.; Buchner, Stephen P.; Melinger, Joseph S.; Perry, Joseph W.; Lotshaw, William T.; Dubikovsky, Vladislav

ناشر: IEEE

سال: 2014

Simulation study of single event effects for split-gate enhanced power U-shape metal-oxide semiconductor field-effect transistor

نوع: Journal Paper

نویسنده : Wang Ying; Cheng-Hao Yu; Fei Cao; Ming-Guang Shan

ناشر: IET

سال: 2014

Voltage regulation of LV feeders with high penetration of PV distributed generation using electronic tap changing transformers

نوع: Conference Paper

نویسنده : Kabiri, Roozbeh; Holmes, Donald Grahame; McGrath, Brendan P.

ناشر: IEEE

سال: 2014

Search

Securing communication in cyber-physical systems using steganography and cryptography

Long-Term Destructive SEE Risk and Calculations Using Multiple “Worst-Case” Events Versus Modelling

Characterization of Heavy-Ion-Induced Single-Event Effects in 65 nm Bulk CMOS ASIC Test Chips

Determination of Single-Event Effect Application Requirements for Enhancement Mode Gallium Nitride HEMTs for Use in Power Distribution Circuits

Single Event Effects in Carbon Nanotube-Based Field Effect Transistors Under Energetic Particle Radiation

A Two-Order Increase in Robustness of Partial Redundancy Under a Radiation Stress Test by Using SDC Prediction

A Dosimetry Methodology for Two-Photon Absorption Induced Single-Event Effects Measurements

Simulation of Light-Matter Interaction and Two-Photon Absorption Induced Charge Deposition by Ultrashort Optical Pulses in Silicon

Simulation study of single event effects for split-gate enhanced power U-shape metal-oxide semiconductor field-effect transistor

Voltage regulation of LV feeders with high penetration of PV distributed generation using electronic tap changing transformers

نویسنده

ناشر

سال

کلیدواژه

نوع

زبان

نوع محتوا

عنوان ناشر

Search

Filters

Securing communication in cyber-physical systems using steganography and cryptography

Long-Term Destructive SEE Risk and Calculations Using Multiple &#x201C;Worst-Case&#x201D; Events Versus Modelling

Characterization of Heavy-Ion-Induced Single-Event Effects in 65&#x00A0;nm Bulk CMOS ASIC Test Chips

Determination of Single-Event Effect Application Requirements for Enhancement Mode Gallium Nitride HEMTs for Use in Power Distribution Circuits

Single Event Effects in Carbon Nanotube-Based Field Effect Transistors Under Energetic Particle Radiation

A Two-Order Increase in Robustness of Partial Redundancy Under a Radiation Stress Test by Using SDC Prediction

A Dosimetry Methodology for Two-Photon Absorption Induced Single-Event Effects Measurements

Simulation of Light-Matter Interaction and Two-Photon Absorption Induced Charge Deposition by Ultrashort Optical Pulses in Silicon

Simulation study of single event effects for split-gate enhanced power U-shape metal-oxide semiconductor field-effect transistor

Voltage regulation of LV feeders with high penetration of PV distributed generation using electronic tap changing transformers

Long-Term Destructive SEE Risk and Calculations Using Multiple “Worst-Case” Events Versus Modelling

Characterization of Heavy-Ion-Induced Single-Event Effects in 65 nm Bulk CMOS ASIC Test Chips