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    GPU Implementation of Inverse Iteration Algorithm for Computing Eigenvectors 

    Type: Conference Paper
    Author : Ishigami, H. , Kimura, K. , Nakamura, Y.
    Publisher: IEEE
    Year: 2014

    Highly sensitive seesaw capacitive pressure sensor based on SOI wafer 

    Type: Journal Paper
    Author : Yang, C.C.; Zhao, Qiming; Gao, C.C.; Liu, G.D.; Zhang, Y.X.; Cui, W.P.; Hao, Y.L.
    Publisher: IET
    Year: 2014

    Silicon Photonic Integration Platform—Have We Found the Sweet Spot? 

    Type: Journal Paper
    Author : Dan-Xia Xu; Schmid, Jens H.; Reed, Graham T.; Mashanovich, Goran Z.; Thomson, David J.; Nedeljkovic, Milos; Xia Chen; Van Thourhout, Dries; Keyvaninia, S.; Selvaraja, Shankar Kumar
    Publisher: IEEE
    Year: 2014

    MEMS Tunneling Sensor Without the Feedback Loop 

    Type: Journal Paper
    Author : Vopilkin, Evgeny /A/.; Klimov, Alexander Yu; Rogov, Vladimir V.; Pryakhin, Dmitry /A/.; Gusev, S.A.; Skorohodov, Evgeny V.; Shuleshova, Irina Yu; Shashkin, V.I.
    Publisher: IEEE
    Year: 2014

    Ask cipher for small amount of data 

    Type: Conference Paper
    Author : Kaushik, A. , Satvika , Gupta, K.
    Publisher: IEEE
    Year: 2014

    Assessing representation techniques of programs supported by GreedEx 

    Type: Conference Paper
    Author : Molina, A.I.; Paredes, M.; Redondo, M.A.; Velazquez, A.
    Publisher: IEEE
    Year: 2014

    Top-Down Fabrication of Epitaxial SiGe/Si Multi-(Core/Shell) p-FET Nanowire Transistors 

    Type: Journal Paper
    Author : Barraud, S.; Hartmann, J.-M.; Maffini-Alvaro, V.; Tosti, L.; Delaye, V.; Lafond, D.
    Publisher: IEEE
    Year: 2014

    High-Efficiency Grating Couplers Near 1310 nm Fabricated by 248-nm DUV Lithography 

    Type: Journal Paper
    Author : Ruizhi Shi; Hang Guan; Novack, Ari; Streshinsky, Matthew; Lim, Andy Eu-Jin; Guo-Qiang Lo; Baehr-Jones, Tom; Hochberg, Michael
    Publisher: IEEE
    Year: 2014

    Development of Experimental Methodology for Highly Efficient Wafer-Level Evaluation of X-Ray Radiation Effects on Semiconductor Devices 

    Type: Journal Paper
    Author : Kudo, Takahiro; Kobayashi, Kaoru; Ono, Shintaro; Watanabe, Toshio; Kinoshita, Hiroyuki; Okihara, Masao; Hatsui, Takaki
    Publisher: IEEE
    Year: 2014

    The dynamics of impediments to the flourishing of engineering as a career for women 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014
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