Search

English
- Persian
- English
Login

Ferdowsi University of Mashhad
|
Information Center and Central Library

- Persian
- English

Home
Source Types
- Journal Paper
- Ebook
- Conference Paper
- Standard
- Protocol
- Thesis
Use Help

FUM Digital Library
Search

FUM Digital Library
Search

All Fields
Title
Author
Year
Publisher
Subject
Publication Title
ISSN
DOI
ISBN

Advanced Search

JavaScript is disabled for your browser. Some features of this site may not work without it.

Search

Show Advanced Filters Hide Advanced Filters

Filters

Use filters to refine the search results.

Now showing items 1-2 of 2

Relevance
Title Asc
Title Desc
Year Asc
Year Desc

5
10
20
40
60
80
100

CSV
RIS

Sort Options:
Relevance
Title Asc
Title Desc
Issue Date Asc
Issue Date Desc
Results Per Page:
5
10
20
40
60
80
100

Impact of Random Telegraph Noise Profiles on Drain-Current Fluctuation During Dynamic Gate Bias

Type: Journal Paper

Author : Wei Feng; Chun Meng Dou; Niwa, Masaaki; Yamada, Koji; Ohmori, Kenji

Publisher: IEEE

Year: 2014

eAdventure: Serious games, assessment and interoperability

Type: Conference Paper

Author : Moreno Ger, P.

Publisher: IEEE

Year: 2014

Author

Chun Meng Dou (1)

Moreno Ger, P. (1)

Niwa, Masaaki (1)

Ohmori, Kenji (1)

Wei Feng (1)

Yamada, Koji (1)

Publisher

IEEE (2)

Year

2014 (2)

Keywords

drain-current fluctuation (1)

dynamic gate bias (1)

Electron traps (1)

field effect transistors (1)

Histograms (1)

Logic gates (1)

MOSFET (1)

MOSFETs (1)

n BTI (1)

n correlated trap sites (1)

Type

Conference Paper (1)

Journal Paper (1)

Language (ISO)

English (2)

Content Type

Metadata Only (2)

Publication Title

Electron Device Letters, IEEE (1)

omputers in Education (SIIE), 2014 International Symposium on (1)

About Us

نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش

DSpace software copyright © 2019-2022 DuraSpace