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    Charge-plasma-based super-steep negative capacitance junctionless tunnel field effect transistor: design and performance 

    Type: Journal Paper
    Author : Singh, Sushil; Pal, Parama; Kondekar, P.N.
    Publisher: IET
    Year: 2014

    Cost effective, reliable and accurate maintenance model for SHP plants using RCM 

    Type: Conference Paper
    Author : Kumar, R. , Singal, S.K.
    Publisher: IEEE
    Year: 2014

    Charge-Plasma Based Process Variation Immune Junctionless Transistor 

    Type: Journal Paper
    Author : Sahu, Chitrakant; Singh, Jaskirat
    Publisher: IEEE
    Year: 2014

    Design and performance projection of symmetric bipolar charge-plasma transistor on SOI 

    Type: Journal Paper
    Author : Sahu, Chitrakant; Ganguly, Anshuman; Singh, Jaskirat
    Publisher: IET
    Year: 2014

    Junctionless Impact Ionization MOS: Proposal and Investigation 

    Type: Journal Paper
    Author : Ramaswamy, S.; Kumar, M.J.
    Publisher: IEEE
    Year: 2014

    Dopingless super-steep impact ionisation MOS (dopingless-IMOS) based on workfunction engineering 

    Type: Journal Paper
    Author : Singh, Sushil; Kondekar, P.N.
    Publisher: IET
    Year: 2014

    Thin-Film Bipolar Transistors on Recrystallized Polycrystalline Silicon Without Impurity Doped Junctions: Proposal and Investigation 

    Type: Journal Paper
    Author : Nadda, Kanika; Kumar, M.J.
    Publisher: IEEE
    Year: 2014

    Cumulative Point&#x2014;L<sub>1</sub> Between Two Positively Charged Plasma Structures (3-D Strata) 

    Type: Journal Paper
    Author : Vysikaylo, P.I.
    Publisher: IEEE
    Year: 2014

    In-Built N<sup>&#x002B;</sup> Pocket p-n-p-n Tunnel Field-Effect Transistor 

    Type: Journal Paper
    Author : Abdi, Dawit; Kumar, M.J.
    Publisher: IEEE
    Year: 2014

    Measurement of axonal fiber connectivity in consciousness evaluation 

    Type: Conference Paper
    Author : Leisman, Gerry; Rojas, Rafael Rodriguez; Batista, Karla; Carballo, Maylen; Morales, Juan M.; Iturria, Yasser; Machado, Calixto
    Publisher: IEEE
    Year: 2014

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