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نمایش تعداد 1-10 از 39

A Low-Cost Fault-Tolerant Technique for Carry Look-Ahead Adder

نوع: Conference Paper

نویسنده : Alireza Namazi; یاسر صداقت; Seyed Ghassem Miremadi; Alireza Ejlali; Yasser Sedaghat

سال: 2009

خلاصه:

This paper proposes a low-cost fault-tolerant Carry Look-Ahead (CLA) adder which consumes much less power and area overheads in comparison with other fault-tolerant CLA adders. Analytical and experimental results show that ...

A Layout-Level Approach to Evaluate and Mitigate the Sensitive Areas of Multiple SETs in Combinational Circuits

نوع: Journal Paper

نویسنده : Yankang Du; Shuming Chen; Jianjun Jianjun

ناشر: IEEE

سال: 2014

Advanced approach for PET breast cancer segmentation based on FAMIS methodology

نوع: Conference Paper

ناشر: IEEE

سال: 2014

DraMon: Predicting memory bandwidth usage of multi-threaded programs with high accuracy and low overhead

نوع: Conference Paper

نویسنده : Wei Wang , Dey, T. , Davidson, J.W. , Soffa, M.L.

ناشر: IEEE

سال: 2014

Synthesis of LTCC multi-band bandpass filter using reflection and transmission zeros

نوع: Conference Paper

نویسنده : Yi-Chieh Lin , Hui-Hsiag Huang , Tzyy-Sheng Horng

ناشر: IEEE

سال: 2014

Single event transient tolerant frequency divider

نوع: Journal Paper

نویسنده : Xiaoxuan She; Ningxi Li

ناشر: IET

سال: 2014

New Insights Into the Single Event Transient Propagation Through Static and TSPC Logic

نوع: Journal Paper

نویسنده : Hamad, Ghaith Bany; Hasan, Syed Rafay; Mohamed, O. Ait; Savaria, Yvon

ناشر: IEEE

سال: 2014

Soft Error Detection and Correction Technique for Radiation Hardening Based on C-element and BICS

نوع: Journal Paper

نویسنده : Gomez Toro, Daniel; Arzel, Matthieu; Seguin, Fabrice; Jezequel, Michel

ناشر: IEEE

سال: 2014

Investigation of Single Event Induced Soft Errors in Programmable Metallization Cell Memory

نوع: Journal Paper

نویسنده : Mahalanabis, Debayan; Barnaby, H.J.; Kozicki, M.N.; Bharadwaj, Vineeth; Rajabi, Saba

ناشر: IEEE

سال: 2014

An Investigation of Single-Event Transients in C-SiGe HBT on SOI Current Mirror Circuits

نوع: Journal Paper

نویسنده : Seungwoo Jung; Lourenco, Nelson E.; Ickhyun Song; Oakley, Michael /A/.; England, Troy D.; Arora, Rajkumar; Cardoso, Adilson S.; Roche, Nicholas J.-H; Khachatrian, Ani; McMorrow, Dale; Buchner, Stephen P.; Melinger, Joseph S.; Warner, Jeffrey H.; Paki-Amouzou, Pauline; Babcock, Jeff /A/.; Cressler, John D.

ناشر: IEEE

سال: 2014

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A Low-Cost Fault-Tolerant Technique for Carry Look-Ahead Adder

A Layout-Level Approach to Evaluate and Mitigate the Sensitive Areas of Multiple SETs in Combinational Circuits

Advanced approach for PET breast cancer segmentation based on FAMIS methodology

DraMon: Predicting memory bandwidth usage of multi-threaded programs with high accuracy and low overhead

Synthesis of LTCC multi-band bandpass filter using reflection and transmission zeros

Single event transient tolerant frequency divider

New Insights Into the Single Event Transient Propagation Through Static and TSPC Logic

Soft Error Detection and Correction Technique for Radiation Hardening Based on C-element and BICS

Investigation of Single Event Induced Soft Errors in Programmable Metallization Cell Memory

An Investigation of Single-Event Transients in C-SiGe HBT on SOI Current Mirror Circuits

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A Low-Cost Fault-Tolerant Technique for Carry Look-Ahead Adder

A Layout-Level Approach to Evaluate and Mitigate the Sensitive Areas of Multiple SETs in Combinational Circuits

Advanced approach for PET breast cancer segmentation based on FAMIS methodology

DraMon: Predicting memory bandwidth usage of multi-threaded programs with high accuracy and low overhead

Synthesis of LTCC multi-band bandpass filter using reflection and transmission zeros

Single event transient tolerant frequency divider

New Insights Into the Single Event Transient Propagation Through Static and TSPC Logic

Soft Error Detection and Correction Technique for Radiation Hardening Based on C-element and BICS

Investigation of Single Event Induced Soft Errors in Programmable Metallization Cell Memory

An Investigation of Single-Event Transients in C-SiGe HBT on SOI Current Mirror Circuits