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Now showing items 1-5 of 5

Mixer-like modeling with dynamic baseband characterization for supply-modulated PAs

Type: Conference Paper

Author : Gibiino, Gian Piero; Avolio, Gustavo; Schreurs, Dominique; Santarelli, Alberto; Filicori, Fabio

Publisher: IEEE

Year: 2014

Pulsed NVNA measurements for dynamic characterization of RF PAs

Type: Conference Paper

Author : Gibiino, Gian Piero; Tafuri, Felice Francesco; Nielsen, Troels S.; Schreurs, Dominique; Santarelli, Alberto

Publisher: IEEE

Year: 2014

A Double-Pulse Technique for the Dynamic I/V Characterization of GaN FETs

Type: Journal Paper

Author : Santarelli, Alberto; Cignani, Rafael; Gibiino, Gian Piero; Niessen, Daniel; Traverso, Pier Andrea; Florian, Corrado; Schreurs, Dominique M. M.-P; Filicori, Fabio

Publisher: IEEE

Year: 2014

Evaluation of GaN FET power performance reduction due to nonlinear charge trapping effects

Type: Conference Paper

Author : Santarelli, Alberto; Cignani, Rafael; Niessen, Daniel; Gibiino, Gian Piero; Traverso, Pier Andrea; Di Giacomo, Valeria; Chang, Christophe; Floriot, Didier; Schreurs, Dominique; Filicori, Fabio

Publisher: IEEE

Year: 2014

GaN FET Nonlinear Modeling Based on Double Pulse <formula formulatype="inline"> <img src="/images/tex/21585.gif" alt="{ I}/{ V}"> </formula> Characteristics

Type: Journal Paper

Author : Santarelli, Alberto; Niessen, Daniel; Cignani, Rafael; Gibiino, Gian Piero; Traverso, Pier Andrea; Florian, Corrado; Schreurs, Dominique M. M.-P; Filicori, Fabio

Publisher: IEEE

Year: 2014

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Mixer-like modeling with dynamic baseband characterization for supply-modulated PAs

Pulsed NVNA measurements for dynamic characterization of RF PAs

A Double-Pulse Technique for the Dynamic I/V Characterization of GaN FETs

Evaluation of GaN FET power performance reduction due to nonlinear charge trapping effects

GaN FET Nonlinear Modeling Based on Double Pulse <formula formulatype="inline"> <img src="/images/tex/21585.gif" alt="{ I}/{ V}"> </formula> Characteristics

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Mixer-like modeling with dynamic baseband characterization for supply-modulated PAs

Pulsed NVNA measurements for dynamic characterization of RF PAs

A Double-Pulse Technique for the Dynamic I/V Characterization of GaN FETs

Evaluation of GaN FET power performance reduction due to nonlinear charge trapping effects

GaN FET Nonlinear Modeling Based on Double Pulse <formula formulatype="inline"> <img src="/images/tex/21585.gif" alt="{ I}/{ V}"> </formula> Characteristics