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Accurate Fast Capacitance Measurements for Reliable Device Characterization
Publisher: IEEE
Year: 2014
Impact of BTI on random logic circuit critical timing
Publisher: IEEE
Year: 2014
Device-Level Experimental Observations of NBTI-Induced Random Timing Jitter
Publisher: IEEE
Year: 2014
PBTI-Induced Random Timing Jitter in Circuit-Speed Random Logic
Publisher: IEEE
Year: 2014



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